I/UCRC FRP: Collaborative Research: Super-resolution methods for microwave emission source microscopy

I/UCRC FRP：合作研究：微波发射源显微镜的超分辨率方法

• 批准号: 1535698
• 负责人: Victor Khilkevich
• 金额: $ 13.19万
• 依托单位: Missouri University of Science and Technology
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2015
• 资助国家: 美国
• 起止时间: 2015-08-15 至 2018-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1535698&HistoricalAwards=false
• 关键词: UCRC; FRP; Collaborative; Research; Super

As clock speeds and data rates in electronic products increase, the problem of unwanted electromagnetic emissions become more and more severe. As a result, during the development of electronic products, considerable amounts of time and effort are spent by electronic device designers in tracking down and resolving electromagnetic compliance issues. Due to the lack of appropriate sensing tools, very often electromagnetic compatibility engineers have to resort to ad hoc trial-and-error techniques to determine compliance, which slows down the device development cycle. Emission source microscopy provides a potentially powerful tool that can improve this situation by imaging and/or mapping the locations of radiating sources in electronic products. However, being essentially equivalent to a microwave microscope, the emission source microscopy technique, presently, has resolution limits that only make it useful at frequencies above ~5 GHz. This research explores ways to improve the resolution limit of microwave microscopy, making it applicable to lower frequencies where the majority of electronic compliance problems occur. Besides direct application in locating sources of unwanted radiation with high accuracy and confidence, which ultimately will reduce production delays, the proposed methods can also be used in the research of radiation mechanisms of electromagnetic energy. Additional broader impacts include the use of this new technology as an educational tool for the visualization of microwave electromagnetic radiation sources. The ultimate goal of this research is to develop super-resolution techniques for microwave emission source microscopy so it can be used to detect sources of electromagnetic radiation with sub-diffraction limit resolution. Research foci to be explored include: (1) development of super-resolution microwave microscopy systems with special point spread function; (2) development of super-resolution microwave microscopy systems with water immersion; and (3) development of STED-inspired super-resolution microwave microscopy systems using movable absorber screens or optically-modulated absorber layers. For each system prototypes will be developed and the resulting resolution, dynamic range, and sensitivity of the technique will be examined experimentally. Measurements will come from experiments with passive structures excited by external sources and active electronic devices.

随着电子产品中的时钟速度和数据速率的增加，不必要的电磁排放问题变得越来越严重。结果，在电子产品的开发过程中，电子设备设计人员花费了相当多的时间和精力来追踪和解决电磁合规性问题。由于缺乏适当的传感工具，经常电磁兼容性工程师必须求助于临时试用技术，以确定合规性，这会减慢设备开发周期。发射源显微镜提供了一种潜在强大的工具，可以通过对电子产品中的辐射源的位置进行成像和/或映射来改善这种情况。 但是，本质上等同于微波显微镜，目前的发射源显微镜技术具有分辨率限制，仅在〜5 GHz以上的频率下它有用。这项研究探讨了改善微波显微镜分辨率极限的方法，使其适用于大多数电子合规性问题的较低频率。除了直接应用以高精度和信心定位不需要的辐射来源（最终将减少生产延迟）外，所提出的方法还可以用于电磁能的辐射机制。其他更广泛的影响包括将这种新技术用作可视化微波电磁辐射源的教育工具。这项研究的最终目的是开发微波发射源显微镜的超分辨率技术，因此可以用于检测具有分辨率分辨率的电磁辐射源。要探索的研究焦点包括：（1）开发具有特殊点扩散功能的超分辨率微波显微镜系统； （2）用浸入水的超分辨率微波显微镜系统的开发； （3）使用可移动吸收剂屏幕或光学调节的吸收层开发了受steD启发的超分辨率微波显微镜系统。对于每个系统的原型，将开发出所得的分辨率，动态范围和技术的灵敏度，将进行实验检查。测量结果将来自由外部源和主动电子设备激发的被动结构的实验。