SHF: Small: A Brick in the Wall: Achieving Yield, Performance and Density Effective DRAM Beyond 22nm Technology

SHF：小型：墙上的砖：实现超越 22 纳米技术的良率、性能和密度有效 DRAM

• 批准号: 1422331
• 负责人: Jun Yang
• 金额: $ 45万
• 依托单位: University of Pittsburgh
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2014
• 资助国家: 美国
• 起止时间: 2014-07-15 至 2019-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1422331&HistoricalAwards=false
• 关键词: SHF; Small; Brick; Wall; Achieving

For more than four decades, computer main memory has predominantly used Dynamic Random Access Memory (DRAM). This technology is a mature commodity that has been optimized and balanced among cost, performance, capacity and energy. Much of DRAM?s success is due to continuous shrinking of the silicon devices in the memory, which allows DRAM capacity to double roughly every two years, satisfying the aggressive need for more memory capacity of today?s and tomorrow?s applications. Yet, a critical problem lies in the shrinking of the device dimensions: It is coming to a halt largely due to the inability of the manufacturing process to precisely control the sizes of a device, which is termed process variation (PV). There are some known problems with PV. However, a vital problem that has rarely been investigated in the past is that PV can cause critical memory operational timing violations. Such violations slash DRAM chip yield, and immediately increase the chip cost. Solving this challenge is crucial to the future of the DRAM industry, which is highly sensitive to cost and profit.This research aims to address the challenge imposed by PV on DRAM device timing to chip yield. Our key approach is to expose inherit operational timing variations caused by PV, so that they can be managed externally by the memory controller. This approach trades exposed timing variability for enhanced chip yield, without harming chip density, by allowing more DRAM chips to meet design specifications. Since the timing variations lead to application performance loss, we propose a suite of techniques that progressively mitigate the loss arising from increasing variance with deeper technology scaling. Our hypothesis is that the threat to yield loss due to technology scaling and PV can be well controlled with our progressive mechanisms, if existing timing constraints for memory operations can adapt to PV-induced speed variations. The broader impact of this research is to enable the continuous scaling of the DRAM technology to achieve the cost, capacity and performance requirement for future computing in engineering, scientific, biological, environmental, business and consumer applications. Both undergraduate and graduate students will be recruited and trained through research and education opportunities provided by this project.

在过去的四十年中，计算机主存储器主要使用动态随机访问存储器（DRAM）。这项技术是一种成熟的商品，在成本，绩效，能源和能源方面已得到优化和平衡。 DRAM的成功大部分是由于记忆中硅设备的连续收缩所致，这使DRAM的容量大约每两年加倍，从而满足了对当今和明天的更多记忆能力的积极需求。 然而，一个关键的问题在于设备尺寸的缩小：这主要是由于制造过程无法精确控制设备的尺寸，该设备的大小称为工艺变化（PV）。 PV有一些已知问题。但是，过去很少研究的一个至关重要的问题是，PV会导致关键的记忆操作违规行为。这种违规行为削减了DRAM芯片的收益，并立即增加了芯片成本。解决这一挑战对于DRAM行业的未来至关重要，该行业对成本和利润非常敏感。这项研究旨在应对PV对DRAM设备时机对CHIP收益的挑战。 我们的关键方法是揭示由PV引起的继承操作定时变化，以便可以由内存控制器在外部进行管理。通过允许更多的DRAM芯片满足设计规格，这种方法可用于增强芯片收益的裸露时间变异性，而不会损害芯片密度。由于定时变化导致应用程序性能损失，我们提出了一套技术，这些技术逐渐减轻了由于随着更深的技术规模而增加的差异而引起的损失。我们的假设是，如果现有的内存操作的计时限制可以适应PV引起的速度变化，则可以通过我们的渐进机制来很好地控制由于技术缩放和PV造成的损失的威胁。这项研究的更广泛的影响是使DRAM技术的持续扩展能够达到工程，科学，生物学，环境，商业和消费者应用中未来计算的成本，能力和绩效要求。本科生和研究生都将通过该项目提供的研究和教育机会招募和培训。

项目成果

PEP: Proactive Checkpointing for Efficient Preemption on GPUs

PEP：主动检查点以实现 GPU 上的高效抢占

• DOI: 10.1109/dac.2018.8465929
• 发表时间: 2018
• 期刊: 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC
• 作者: Li, Chen;Yang, Jun;Zigerelli, Andrew;Guo, Yang
• 通讯作者: Guo, Yang

D-ORAM: Path-ORAM Delegation for Low Execution Interference on Cloud Servers with Untrusted Memory

D-ORAM：路径 ORAM 委派，可在具有不可信内存的云服务器上实现低执行干扰

• DOI: 10.1109/hpca.2018.00043
• 发表时间: 2018
• 期刊: 2018 IEEE International Symposium on High Performance Computer Architecture (HPCA
• 作者: Wang, Rujia;Zhang, Youtao;Yang, Jun
• 通讯作者: Yang, Jun

Enabling Intra-Plane Parallel Block Erase in NAND Flash to Alleviate the Impact of Garbage Collection

• DOI: 10.1145/3218603.3218627
• 发表时间: 2018-07
• 期刊: Proceedings of the International Symposium on Low Power Electronics and Design
• 作者: Tyler Garrett;Jun Yang;Youtao Zhang

A Process-Variation-Tolerant Method for Nanophotonic On-Chip Network

纳米光子片上网络的工艺变化容忍方法

• DOI: 10.1145/3208073
• 发表时间: 2018
• 期刊: ACM Journal on Emerging Technologies in Computing Systems
• 影响因子: 2.2
• 作者: Xu, Yi;Yang, Jun;Melhem, Rami
• 通讯作者: Melhem, Rami

Boosting chipkill capability under retention-error induced reliability emergency

提高保留错误引起的可靠性紧急情况下的芯片消除能力

• DOI: 10.1145/3287624.3287639
• 发表时间: 2019
• 期刊: Proceedings of the 24th Asia and South Pacific Design Automation Conference
• 作者: Zhang, Xianwei;Wang, Rujia;Zhang, Youtao;Yang, Jun
• 通讯作者: Yang, Jun