MRI: Acquisition of a Field-Emission Scanning Electron Microscope with Elemental Analysis Capability for Enhancing Materials Research at the University of South Dakota

MRI：南达科他大学购买具有元素分析功能的场发射扫描电子显微镜，以加强材料研究

• 批准号: 1337707
• 负责人: Chaoyang Jiang
• 金额: $ 29.79万
• 依托单位: University of South Dakota Main Campus
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-09-15 至 2017-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1337707&HistoricalAwards=false
• 关键词: MRI; Acquisition; Field; Emission; Scanning

With this award from the Chemistry Major Research Instrumentation (MRI) Program that is cofunded by the Chemistry Research Instrumentation Program, Professor Chaoyang Jiang from University of South Dakota and colleagues Dongming Mei, Paul May and Ranjit Koodali will acquire a high-resolution field emission scanning electron microscope (FE-SEM) with an energy-dispersive X-ray spectroscopy (EDS) attachment for elemental analysis and mapping. The proposal is aimed at enhancing research and education at all levels, especially in areas such as (a) plasmonic enhancement of near-infrared-to-visible luminescence; (b) thin films by laser assisted chemical vapor deposition; (c) cubic mesoporous materials with varied morphologies; (d) cuprous oxide nanoparticles; (e) fluorinated polymeric materials for air-stable and moisture-resistant flexible optoelectronics; (f) metal-semiconductor hybrid nanocrystals for solar fuels catalysis; (g) dissociation density characterization and wafer processing of ultrapure germanium single crystals; (h) research on the pigments in paintings on historical music instruments; and (i) materials characterization for earth science research.A scanning electron microscope (SEM) is one of the basic tools available for the characterization of materials. A beam of electrons scans the surface of a sample resulting in a microimage of the sample composition. The electron microscope can provide higher resolution and magnification than a microscope using light to probe the material. Characteristic X-rays are produced from interaction with atoms in the sample that when dispersed provide information on the elemental composition (EDS). This instrumentation will provide microscopy training and research opportunities to graduate and undergraduate students across many fields including chemistry, earth sciences and environmental science fields preparing them for the demands of the 21st century workforce in science and technology. The instrumentation will impact research and research training of researchers and students not only at the University of South Dakota but also at neighboring institutions and tribal colleges such as Barrett Eichler, Augustana College; Carl Fictorie, Dordt College (Sioux City, Iowa); and Subodh Singh and Sinte Gleska University.

凭借化学研究仪器计划共同资助的化学专业研究仪器 (MRI) 计划的这一奖项，南达科他大学的朝阳教授及其同事梅东明、保罗·梅和兰吉特·库达利将获得高分辨率场发射扫描仪带有能量色散 X 射线光谱 (EDS) 附件的电子显微镜 (FE-SEM)，用于元素分析和绘图。该提案旨在加强各级的研究和教育，特别是在以下领域：(a) 近红外至可见光发光的等离子体增强； (b) 激光辅助化学气相沉积薄膜； (c) 具有不同形态的立方介孔材料； (d)氧化亚铜纳米颗粒； (e) 用于空气稳定且防潮的柔性光电子学的氟化聚合物材料； (f) 用于太阳能燃料催化的金属-半导体混合纳米晶体； (g) 超纯锗单晶的解离密度表征和晶片加工； (h) 对历史乐器绘画中的颜料进行研究； (i) 用于地球科学研究的材料表征。扫描电子显微镜 (SEM) 是可用于材料表征的基本工具之一。电子束扫描样品表面，产生样品成分的显微图像。与使用光探测材料的显微镜相比，电子显微镜可以提供更高的分辨率和放大倍数。特征 X 射线是由样品中的原子相互作用产生的，当原子分散时，可以提供有关元素成分 (EDS) 的信息。该仪器将为化学、地球科学和环境科学领域等多个领域的研究生和本科生提供显微镜培训和研究机会，为他们满足 21 世纪科学技术劳动力的需求做好准备。该仪器不仅将影响南达科他大学的研究人员和学生的研究和研究培训，还将影响邻近的机构和部落学院，如巴雷特·艾希勒、奥古斯塔纳学院； Carl Fictorie，多特学院（爱荷华州苏城）；以及 Subodh Singh 和 Sinte Gleska 大学。