Differential Speckle Survey Instrument

差分散斑测量仪

• 批准号: 0504010
• 负责人: Elliott Horch
• 金额: $ 35.25万
• 依托单位: University of Massachusetts, Dartmouth
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2005
• 资助国家: 美国
• 起止时间: 2005-09-01 至 2007-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0504010&HistoricalAwards=false
• 关键词: Differential; Speckle; Survey; Instrument

AST-0504010 -- Horch/U Mass DartmouthThe award covers the development and construction of the Differential Speckle Survey Instrument. This instrument builds upon a previous speckle imager developed by the investigators that is compatible with any large format CCD and uses the large area of such a CCD as a memory cache of many speckle images prior to a full-frame readout. The Differential Speckle Survey Instrument will use the same idea, but will collect speckle patterns in two colors simultaneously in order to obtain image information below the diffraction limit of a large telescope. The Differential Speckle Survey Instrument will be an important tool for ongoing long baseline interferometer projects.

AST-0504010-HORCH/U MASS DARTMOUTH该奖项涵盖了差分斑点调查工具的开发和构建。该仪器建立在调查人员开发的先前斑点成像仪的基础上，该成像仪与任何大格式CCD兼容，并将此类CCD的大面积用作许多斑点图像的内存缓存，然后再进行全帧读数。差分斑点调查仪器将使用相同的想法，但将同时收集两种颜色的斑点图案，以便在大型望远镜的衍射极限下方获得图像信息。差分斑点调查仪器将是持续的长基线干涉仪项目的重要工具。