CAREER: Local Probing of Electron-electron Interactions in Nanostructures

职业：纳米结构中电子-电子相互作用的局部探测

• 批准号: 0239748
• 负责人: Gleb Finkelstein
• 金额: --
• 依托单位: Duke University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2003
• 资助国家: 美国
• 起止时间: 2003-05-01 至 2009-04-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0239748&HistoricalAwards=false
• 关键词: CAREER; Local; Probing; Electron; electron

This CAREER project focuses on studying the local mechanisms that govern the behavior of several nanoscale systems under intensive scientific investigation. The project will provide training in the novel scanned probe methods, low temperature instrumentation and nanofabrication methods to the graduate, undergraduate and high school students involved. In particular, scanned probe techniques will be actively implemented, including the novel "scanning gate" microscopy and the scanning capacitance microscopy that are especially suited to study nanostructures. The main directions include: imaging the electron wave functions in quantum dots and a two- dimensional insulator, and studies of electron distribution in carbon nanotubes. The project will enhance understanding of electron-electron interaction phenomena in the nanostructures of active current interest and will significantly develop the novel scanning gate and scanning capacitive microscopy. This CAREER project focuses on studying the local mechanisms that govern the electron-electron interactions in several nanoscale systems under intensive scientific investigation. Scanned probe techniques will be actively implemented, in particular the novel "scanning gate" microscopy and the scanning capacitance microscopy that are especially suited to study nanostructures. The main directions include imaging the electron distribution in quantum dots and a two- dimensional insulator, and studies of electron energy distribution in carbon nanotubes. 1) The electron distribution in a lateral quantum dot will be probed by measuring the electric conductivity through the dot as a biased tip is scanned above the sample surface (scanning gate microscopy). 2) A vertical quantum dot will be induced by the biased tip and scanned inside the heterostucture. 3) Localized electrons in the insulating two-dimensional electron gas will be imaged by the scanning capacitance microscopy. 4) Electron distribution in a carbon nanotube will be locally probed. This project will provide training in the novel scanned probe methods, low temperature instrumentation and microfabrication methods to the graduate, undergraduate and high school students involved.

该职业项目的重点是在深入的科学研究下研究控制多个纳米级系统行为的局部机制。该项目将为相关研究生、本科生和高中生提供新型扫描探针方法、低温仪器和纳米制造方法的培训。 特别是，扫描探针技术将得到积极实施，包括特别适合研究纳米结构的新型“扫描门”显微镜和扫描电容显微镜。主要方向包括：量子点和二维绝缘体中电子波函数的成像，以及碳纳米管中电子分布的研究。该项目将增强对活性电流感兴趣的纳米结构中电子-电子相互作用现象的理解，并将显着开发新型扫描门和扫描电容显微镜。 该职业项目的重点是在深入的科学研究下研究控制几个纳米级系统中电子-电子相互作用的局部机制。将积极实施扫描探针技术，特别是特别适合研究纳米结构的新型“扫描门”显微镜和扫描电容显微镜。主要方向包括量子点和二维绝缘体中电子分布的成像，以及碳纳米管中电子能量分布的研究。 1) 当偏置尖端在样品表面上方扫描时，通过测量穿过点的电导率来探测横向量子点中的电子分布（扫描门显微镜）。 2) 偏置尖端将诱导垂直量子点并在异质结构内部进行扫描。 3) 绝缘二维电子气中的局域电子将通过扫描电容显微镜成像。 4) 将局部探测碳纳米管中的电子分布。该项目将为相关研究生、本科生和高中生提供新型扫描探针方法、低温仪器和微加工方法的培训。