Semiconductor Measurements Laboratory

半导体测量实验室

• 批准号: 8853239
• 负责人: Robert Pierret
• 金额: $ 10万
• 依托单位: Purdue University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1988
• 资助国家: 美国
• 起止时间: 1988-11-15 至 1991-04-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8853239&HistoricalAwards=false
• 关键词: Semiconductor; Measurements; Laboratory

The detailed examination of the electrical characteristics exhibited by semiconductor (or solid-state) devices, and the extraction of basic "inside-the-device" information from those characteristics, are referred to as semiconductor measurements. Equipment in the undergraduate laboratory where semiconductor measurements are performed is enhanced and the associated experiments revised. Specifically, modern test equipment is to be acquired to perform current-voltage, capacitance-voltage, transient response, low- temperature, and a limited number of advanced characterization measurements. The instrumentation is to be grouped so as to form permanent stations of a functional nature. In this way the laboratory will simultaneously provide ready equipment access for interrogating devices (fabricated by students in a separate teaching laboratory) and for performing undergraduate student projects.

对半导体（或固态）器件所表现出的电气特性的详细检查，以及从这些特性中提取基本的“器件内部”信息，被称为半导体测量。 本科实验室进行半导体测量的设备得到了增强，相关实验也得到了修改。 具体来说，需要购买现代测试设备来执行电流-电压、电容-电压、瞬态响应、低温和有限数量的高级表征测量。 仪器将被分组以形成具有功能性的永久站。 通过这种方式，实验室将同时为询问设备（由学生在单独的教学实验室中制造）和执行本科生项目提供现成的设备访问。