单像素成像在三维测量中的应用

In traditional structured light 3D measurement technologies such as fringe projection, high-quality and high-precision 3D measurement results cannot be obtained under the interference of global illumination. Typical global illumination effects include inter-reflection and subsurface scattering. Inter-reflection occurs on concave bright reflective surfaces, while subsurface scattering occurs on the surfaces of translucent materials. Single-pixel imaging (SI) technology can capture a scene with a detector without spatial resolution. However, most modern digital cameras use traditional pixelated image sensors. Here, we propose to extend the single-pixel imaging technology to pixelated image sensors, where each pixel on the image sensor is regarded as an independent single-pixel imaging unit and images can be acquired simultaneously. Experiments show that this single-pixel imaging method can completely decompose direct illumination and global illumination, achieving high-quality and high-precision 3D reconstruction under the interference of global illumination.

在条纹投影等传统结构光三维测量技术中,在全局光照的干扰下,无法获得高质量、高精度的三维测量结果。典型的全局光照效应包括互反射和次表面散射。互反射发生在凹陷的光亮反射表面,而次表面散射发生在半透明材料表面。单像素成像(Single-pixel imaging, SI)技术可以通过没有空间分辨率的探测器捕获场景,然而,大多数现代数码相机采用传统像素化的图像传感器。在这里,我们提出了将单像素成像技术扩展到像素化的图像传感器中,将图像传感器上的每个像素都被视为是一个独立的单像素成像单元,可以同时获取图像。实验表明,这种单像素成像方法可以完全分解直接光照和全局光照,实现在全局光照干扰下的高质量、高精度三维重建。