Electronic transport in multiwalled carbon nanotubes contacted with patterned electrodes

The electrical conductance of 0.8 similar to 5-mum-long multiwalled carbon nanotubes (MWCNT) was measured at room temperature in a multiprobe scanning tunneling microscope (STM)-scanning electron microscope (SEM) system and a conventional prober system, by bringing the MWCNTs into contact with patterned metal electrodes. The contact resistance between the CNTs and metal electrodes was sufficiently small. The conductance was proportional to AIL (and also to B/L, within our experimental error), where A, B, and L are the cross,section, circumference, and length of CNTs. This indicates the occurrence of diffusive transport. A nonlinear current-voltage characteristic was obtained; the conductance increased steeply with current. A multiprobe STM-SEM system was very useful for measuring individual CNTs.

在室温下，通过使多壁碳纳米管（MWCNT）与图案化金属电极接触，在多探针扫描隧道显微镜（STM） - 扫描电子显微镜（SEM）系统和常规探针系统中测量了0.8根类似于5微米长的多壁碳纳米管的电导。碳纳米管与金属电极之间的接触电阻足够小。电导与AIL成正比（在我们的实验误差范围内，也与B/L成正比），其中A、B和L分别是碳纳米管的横截面积、周长和长度。这表明发生了扩散输运。得到了非线性的电流 - 电压特性；电导随电流急剧增加。多探针STM - SEM系统对于测量单个碳纳米管非常有用。