一种考虑屏蔽效应的电路输入向量敏感性计算方法

The calculation of input vector sensitivity has important practical significance in the highly reliable design process of circuits, especially for circuit products with specific application scenarios. Using the probabilistic transfer matrix model as the main technical means, this paper first briefly analyzes the "driving away" effect of input vectors on circuit faults. Then, based on the shielding mechanism, three quantitative models of shielding effects for basic circuit components are constructed. Subsequently, by using mixed coding and the observable sensitive input vectors at the output ends of basic circuit components constructed by the virtual method, the iterative propagation of input vector sensitivity is achieved. Then, combined with the norm theory, the sensitivity of circuit input vectors is calculated. Theoretical analysis and experimental results show that the calculation accuracy of the method proposed in this paper is similar to that of the same type of methods, but the calculation speed is 2 - 6 times faster, the memory consumption is slightly smaller, and the calculation process is more flexible and simple. It is an effective calculation model with strong operability, and its space - time complexity has a linear growth relationship with the number of basic circuit components. In addition, experiments have found that the sensitivity of input vectors increases with the increase of the fault probability of basic circuit components, and the influence of electrical shielding effects and latch window shielding effects on the sensitivity of input vectors also shows an increasing trend with the increase of the fault probability of basic circuit components, especially for electrical shielding effects.

输入向量敏感性的计算在电路的高可靠设计过程中有着重要的实际意义,尤其是针对有着特定应用场景的电路产品.该文以概率转移矩阵模型为主要技术手段,首先简要分析了输入向量对电路故障的“驱赶”作用,接着基于屏蔽机理构建了针对电路基本构件的三种屏蔽效应的量化模型,然后利用混合编码并通过虚拟法构建的电路基本构件输出端的可观察敏感性输入向量实现了输入向量敏感性的迭代传播,再结合范数理论计算了电路输入向量的敏感性.理论分析与实验结果表明,该文所提方法的计算精度与同类型方法相似,但计算速度要快2~6倍,内存开销稍小,计算过程则更为灵巧与简便,是一种可操作性强的有效计算模型,其时空复杂性与电路中的基本构件数目成线性增长的关系.此外,实验发现输入向量的敏感性随电路基本构件故障概率的增大而增大,且电屏蔽效应与锁存窗屏蔽效应对输入向量敏感性的影响也随电路基本构件故障概率的增大而呈现出增强的趋势,电屏蔽效应尤甚.