星载系统芯片(SoC)的抗辐射加固设计研究

With the rapid development of aerospace engineering, reliability of spaceborne SoC is very important since chip is the key control unit. The dominant reliability issue is the high energy ion in the space radiation environment. So radiation harden by design for spaceborne SoC has become research focus. This NSFC proposal describes a research plan as following. Firstly, this proposal focuses on the radiation hardened cell to tolerate multiple node upset. It is based on multiple modular redundancy and interlock scheme, whick can tolerate multiple node upset induced by high energy particle striking. Secondly, this proposal addresses multiple event transient induced soft error rate analysis. Fault node pairs are extracted from netlist. Overlapped pulse model of multiple event transient are setup. Four-value logic is used to analysis the propagation and masking of multiple event transient, which can analysis the soft error rate accurately. Thirdly, this proposal implements statistical soft error rate analysis. The electrical characteristic of a gate cell is no longer a fixed value because of NBTI induced aging. Dynamic aging aware cell model is setup to describe the time-dependent electrical characteristic of a gate cell. It will implement fast and accurate soft error rate analysis.This research will present a radiation harden by design solution with high cost performance.

我国航天事业正在实现跨越式发展，作为航天器的核心控制部件，星载系统芯片（SoC）的可靠性至关重要。空间辐射环境中的高能粒子是影响星载SoC可靠性的主导性因素，星载SoC的抗辐射加固设计成为研究热点。本项目从三个方面开展研究：第一，研究容忍多节点翻转的加固时序单元。在时序单元内部构建多模冗余结构，彼此形成交叉互锁机制，有效容忍高能粒子引起的多节点翻转。第二，研究多粒子瞬态导致的电路软错误率评估。解析电路门级网表提取故障节点对，建立多粒子瞬态脉冲复合模型，使用四值逻辑来分析多粒子瞬态在电路中的传播和屏蔽，累计得到准确的软错误率。第三，研究基于统计框架的软错误率评估，考虑老化因素，建立老化感知的电路单元动态模型，电路单元的电气参数随着时间梯度动态变化，从而精确快速计算电路的软错误率。本项目将为星载SoC的抗辐射加固设计提供高性价比的解决方案，具有重要的科学意义和应用前景。