International Collaboration in Chemistry: Novel Instrumentation for Modern Elemental Speciation Analysis

化学国际合作：现代元素形态分析的新型仪器

基本信息

批准号：
84887454
负责人：
Dr. Wolfgang Buscher
金额：
--
依托单位：
Abteilung 1: Analytische Chemie, Referenzmaterialien
依托单位国家：
德国
项目类别：
Research Grants
财政年份：
2008
资助国家：
德国
起止时间：
2007-12-31 至 2012-12-31
项目状态：
已结题

来源：
https://gepris.dfg.de/gepris/projekt/84887454?language=en
关键词：
International Collaboration Chemistry Novel Instrumentation

项目摘要

The surface composition of a solid has a profound influence on its chemical, physical and material properties. This is because many important phenomena (e.g. optical interaction, electron transfer, etc.) are localized at the solid interface; thus, elucidating the composition of the surface layers is crucial to understanding a host of chemical and physical behaviors, as well as informing the construction of new materials. The aim of this proposal is the continued development of a novel, simple, general, and relativer/ inexpensive analytical instrument capable of providing new surface analysis capabilities. Specifically, the instrument employs atomic-emission spectrometry (AES) for the elemental analysis of solid materials with three dimensional spatial resolution. A novel pulsed glow discharge (GD) is used to sputter atoms from the surface of conductive, semiconductor, or insulator samples, and subsequently excite them to be detected by AES. The GD provides depth-profiling analysis of the surface with nanometer resolution by progressively sputtering away surface material and analyzing the constituent atoms. The pulsed GD provides lateral spatial resolution by restricting the distance agas-phase atom travels from the point from which it was initially sputtered before it is excited and detected. The ultimate result of this novel GD-AES analysis is then a 3-dimensional (3-D) multi elemental emission map revealing the location, type, and quantity of atoms within the solid sample. Studies conducted under prior NSF and DFG support have verified the viability of such an instrument. For further details, e.g. applications in biomolecule and structured materials analyses, see NSF part of the application.

固体的表面成分对其化学、物理和材料性能有着深远的影响。这是因为许多重要的现象（例如光学相互作用、电子转移等）都集中在固体界面上；因此，阐明表面层的组成对于理解许多化学和物理行为以及为新材料的构造提供信息至关重要。该提案的目的是继续开发一种新颖、简单、通用且相对/廉价的分析仪器，能够提供新的表面分析功能。具体来说，该仪器采用原子发射光谱法（AES）以三维空间分辨率对固体材料进行元素分析。一种新颖的脉冲辉光放电 (GD) 用于从导电、半导体或绝缘体样品的表面溅射原子，然后激发它们以通过 AES 进行检测。 GD 通过逐步溅射表面材料并分析组成原子，以纳米分辨率对表面进行深度剖析。脉冲 GD 通过限制气相原子在被激发和检测之前从最初溅射点移动的距离来提供横向空间分辨率。这种新颖的 GD-AES 分析的最终结果是一个 3 维 (3-D) 多元素发射图，揭示了固体样品中原子的位置、类型和数量。在 NSF 和 DFG 之前的支持下进行的研究已经验证了这种工具的可行性。有关更多详细信息，例如在生物分子和结构材料分析中的应用，请参阅 NSF 申请的部分。