Defect control in p-type oxide semiconductor for device application

用于器件应用的 p 型氧化物半导体的缺陷控制

• 批准号: 21686061
• 负责人: YANAGI Hiroshi
• 金额: $ 17.97万
• 依托单位: University of Yamanashi
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Young Scientists (A)
• 财政年份: 2009
• 资助国家: 日本
• 起止时间: 2009 至 2011
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-21686061/
• 关键词: p型酸化物半導体; 価数制御; 界面制御; 光電子分光

Cu valency at the Cu_2O film surface and Cu_2O/Al_2O_x interface were studied by X-ray photoelectron spectroscopy. We revealed that Cu valency at the interfaces is always Cu^<2+> and this result was not affected by deposition order. We also revealed that vacuum annealing was effective to reduce Cu^<2+> to Cu^+at the interface, but it does not work when thick film was deposited on the interface.

通过X射线光电子光谱研究了CU_2O膜表面和Cu_2O/Al_2O_X界面处的CU价态。我们揭示了界面处的Cu valency始终是Cu^<2+>，并且该结果不受沉积顺序的影响。我们还透露，真空退火有效地将Cu^<2+>降低到界面处的Cu^+，但是当将厚膜沉积在界面上时，它不起作用。

项目成果

Photovoltaic properties ofn-type a-In-Ga-Zn-O/p-type c-Si heterojunction solar cells

n型a-In-Ga-Zn-O/p型c-Si异质结太阳能电池的光伏特性

• 发表时间: 2011
• 作者: Kyeongmi Lee;Kenji Nomura;Hiroshi Yanagi;Toshio Kamiya;and Hideo Hosono
• 通讯作者: and Hideo Hosono

光電子分光法によるCu_2O/酸化物絶縁体界面の電子状態の観察

光电子能谱观察Cu_2O/氧化物绝缘体界面电子态

• 发表时间: 2009
• 作者: 柳博;Shunyi Li;Andre Wachau,松崎功佑,神谷利夫;Andreas Klein,細野秀雄
• 通讯作者: Andreas Klein,細野秀雄

Low-temperature deposition of high mobility Cu_2O thin films for a-IGZO/Cu_2O heterojunction solar cell

用于a-IGZO/Cu_2O异质结太阳能电池的高迁移率Cu_2O薄膜的低温沉积

• 发表时间: 2012
• 作者: H. Yanagi;K. Lee;K. Nomura;T. Kamiya;and H. Hosono
• 通讯作者: and H. Hosono

Electronic Structures of p-type Cu_2O and Delafossite-Type Oxides Studied by Photoelectron Spectroscopy

光电子能谱研究p型Cu_2O和铜铁矿型氧化物的电子结构

• 发表时间: 2011
• 作者: Hiroshi Yanagi;Risa Yoshihara;Nobuhito Takagi;Toshio Kamiya;and Hideo Hosono
• 通讯作者: and Hideo Hosono

Application of HAXPES to New Transparent Oxide Semiconductors : Transparent Amorphous Oxide Semiconductors & Room Temperature Stable Electride

HAXPES 在新型透明氧化物半导体中的应用：透明非晶氧化物半导体

• 发表时间: 2009
• 作者: Y. Takahashi;Y. Nishino;H. Furukawa;H. Kubo;K. Yamauchi;T. Ishikawa and E. Matsubara;藤森繁,丸山一平;Hiroshi Yanagi
• 通讯作者: Hiroshi Yanagi