Development of an X-ray Poralimeter Using Direct X-ray Imaging CCD with Position, Energy and Time Resolution

使用具有位置、能量和时间分辨率的直接 X 射线成像 CCD 开发 X 射线偏振计

基本信息

批准号：
07554002
负责人：
TSUNEMI Hiroshi
金额：
$ 13.5万
依托单位：
OSAKA UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
1995
资助国家：
日本
起止时间：
1995 至 1996
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07554002/
关键词：
CCD X-ray Polarimeter Detection Efficiency X-ray Generator Depletion Layr Energy Resolution X-ray Astronomy X線発生装置 X線検出器偏光X線 X線検出

项目摘要

The purpose of this research project is to improve not only the fundamental properties of X-ray CCD but also as an X-ray polarimeter. The research group consists of the member s in Hamamatsu photnonics (HPK) and the members in Osaka university. According to the specification determined by all the members, the CCD chips were fabricated at HPK,and the university side operated and examined those chips.Several kinds of CCD chips using different material and production methods have been made. We got eventually energy resolution of 140 eV for 5.9 keV X-rays with a CCD chip of which pixel size is 12 mum and pixel number is 512x512. Although the resolution was 160 eV at the end of the first year in the research term, reduction of the dark current by 1/50 lead to the better resolution. Using high registivity material, we got a CCD chip of which depletion layr is as thick as 20 mum.University side activities include the development of CCD operation and evaluation ; 1) spectrometer system for measuing the CCD detection efficiency for 0.4-2.2keV X-rays, 2) CCD drive clock to suppress spurious charge noise, 3) high speed read-out system using DSP,4) simulation code for X-ray absorption and charge collection process within CCD.Adding these, we invented a novel method for measuring detection efficiency for sub-pixel size structure by employing a mesh in front of the CCD chip. We also measured polarization degree of the X-ray beam from a laboratory X-ray generator. CCD chips with pixel size of 6 mum, which should be effective for X-ray polarimetry, were started to fabricate. The polarimeter-capability of those small pixel size CCD will be measured within the year of 1997.

该研究项目的目的不仅在于提高 X 射线 CCD 的基本性能，而且还在于提高 X 射线偏振计的性能。该研究小组由滨松光子学（HPK）的成员和大阪大学的成员组成。根据全体成员确定的规格，在HPK制造CCD芯片，并由校方对这些芯片进行操作和检验。已制造出多种采用不同材料和生产方法的CCD芯片。我们最终使用像素尺寸为12μm、像素数为512x512的CCD芯片对5.9keV X射线获得了140eV的能量分辨率。尽管在研究期间第一年结束时分辨率为160 eV，但暗电流减少1/50会带来更好的分辨率。采用高电阻率材料，得到了耗尽层厚度达20μm的CCD芯片。校外活动包括CCD操作和评估的开发； 1) 用于测量 0.4-2.2keV X 射线 CCD 检测效率的光谱仪系统，2) 用于抑制杂散电荷噪声的 CCD 驱动时钟，3) 使用 DSP 的高速读出系统，4) 用于 X 射线吸收的模拟代码加上这些，我们发明了一种通过在 CCD 芯片前面使用网格来测量亚像素尺寸结构的检测效率的新方法。我们还测量了实验室 X 射线发生器的 X 射线束的偏振度。开始制作像素尺寸为6μm、可有效用于X射线偏振测量的CCD芯片。这些小像素尺寸 CCD 的旋光仪能力将在 1997 年内进行测量。