Micro-Raman and Photoluminescence Spectrometer

显微拉曼和光致发光光谱仪

• 批准号: 534959777
• 金额: --
• 依托单位: Universität Münster
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2024
• 资助国家: 德国
• 起止时间: 2023-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/534959777?language=en
• 关键词: Micro; Raman; Photoluminescence; Spectrometer

In this proposal, the funding of a confocal micro-Raman and photoluminescence spectrometer is requested. This system will be used for the comprehensive investigation of crystalline and hybrid quantum and nanomaterials, in particular two-dimensional (2D) materials. A major focus is on the characterization of the crystal quality and the interfacial properties of 2D materials and related van der Waals (vdW) heterostacks and hybrid structures. Those structures are mostly prepared by micromechanical exfoliation and vdW assembly. Examples of the materials to be studied include semiconducting transition metal dichalcogenides (TMDC), graphene, hexagonal boron nitride, defect-based quantum emitters in 2D membranes, magnetic and multiferroic 2D materials, 2D polar metals with crystal phase transitions, twisted homo- and heterobilayers partially embedded in field-effect circuits, as well as hybrid structures consisting, for example, of Mie-Voids combined with 2D materials with strong excitonic light-matter interaction. A special focus is on the investigation of twisted bilayers for the experimental realization and study of Mott-Hubbard simulators. Since the start of intensive worldwide research on 2D materials, the so-called phonon fingerprint, which is experimentally accessible using Raman spectroscopy, has proven to be a very important tool to access the properties of 2D materials and related hetero- and hybrid structures. The phonon modes are sensitive to type of material and crystal structure, number of layers, strains, defects, charge carrier density, temperature, interlayer coupling, and in the case of twisted layers also to the angle between two layers. The proposed confocal µ-Raman microscope is used to study and characterize those properties non-destructively and with diffraction-limited lateral resolution with high throughput using non-resonant Raman spectroscopy. The combined micro-Raman and Micro-photoluminescence spectroscopy is established as a very powerful method to comprehensively assess the quality and homogeneity of crystalline solids and in particular of 2D structures and vdW assemblies. Comprehensive and easy access to this methodology has a direct effect on the quality of the generated structures. The sensitivity of the analytical methods as wells as the number of samples that can be analyzed per time limits the quality and the quantity of structures that can be prepared. The number of high-quality samples that can be produced is therefore limited by the throughput of the characterization. The requested mirco-Raman and photoluminescence system will make this high-quality and high throughput analysis accessible even to users who are not experienced in optical setups without an extensive training period.

在该提案中，要求资助共焦显微拉曼和光致发光光谱仪，该系统将用于晶体和混合量子和纳米材料的综合研究，特别是二维（2D）材料。二维材料和相关范德华 (vdW) 异质叠层和混合结构的晶体质量和界面特性的表征这些结构主要是通过微机械剥离和 vdW 制备的。要研究的材料示例包括半导体过渡金属二硫属化物 (TMDC)、石墨烯、六方氮化硼、二维膜中基于缺陷的量子发射器、磁性和多铁性二维材料、具有晶体相变的二维极性金属、扭曲同质材料。和部分嵌入场效应电路中的异双层，以及混合结构，例如由 Mie-Voids 与 2D 材料相结合组成自从世界范围内开始对二维材料（即所谓的声子指纹）进行深入研究以来，我们特别关注扭曲双层的研究。声子模式可以使用拉曼光谱来获取，已被证明是获取二维材料和相关异质和混合结构特性的非常重要的工具，声子模式对材料类型和晶体结构、层数敏感。应变、缺陷、载流子密度、温度、层间耦合，以及在扭曲层的情况下，还包括两层之间的角度。所提出的共焦μ拉曼显微镜用于非破坏性地和衍射地研究和表征这些特性。使用非共振拉曼光谱法实现有限横向分辨率和高通量将显微拉曼光谱和显微光致发光光谱结合起来，是一种非常强大的方法，可以全面评估晶体固体的质量和均匀性。特别是 2D 结构和 vdW 组件，全面且轻松地使用该方法对生成的结构的质量有直接影响。分析方法的灵敏度以及每次可分析的样品数量限制了分析方法的质量。因此，可以制备的高质量样品的数量受到表征吞吐量的限制，所需的显微拉曼和光致发光系统将使这种高质量和高品质。即使没有光学设置经验且未经大量培训的用户也可以进行吞吐量分析。