Polarization study of molecules at surfaces by scanning probe method

扫描探针法研究表面分子的偏振

• 批准号: 14205009
• 负责人: YAMADA Hirofumi
• 金额: $ 34.69万
• 依托单位: Kyoto University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (A)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2004
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-14205009/
• 关键词: dynamic force microscopy; DFM; NC-AFM; Kelvin-probe force microscopy; KFM; molecular-resolution imaging; molecular polarization; frequency modulation detection method; 局所電解制御; ナノスケール分極制御; フタロシアニン分子; 強誘電性高分子; ダイナミック分極処理; 非接触原子間力顕微鏡; アルカンチオール

There has been a great progress in dynamic force microscopy(DFM) and the related techniques. Atomic force microscopy(AFM) has been proved to be a powerful tool for nondestructive, atomic-resolution imaging of various materials including organic molecules, which are often difficult to be investigated by scanning tunneling microscopy(STM). Some of AFM-based techniques such as Kelvin-probe force microscopy(KFM) are capable of investigating nanometer-scale electrical properties. In addition, AFM probe can basically enables us to directly access an object and to modify the structures and/or the properties. On the other hand, since electrical polarization or local electric field at the interface between molecules and a substrate are strongly related to electrical junction properties or ferroelectric domain formation, it is actually indispensable for understanding the physical origins of the interfacial polarization in the engineering aspect, especially in the application of the polarization control of molecules to the molecular electronics.In this project we demonstrated that evaluation and control of molecular polarization was performed by newly developed techniques, which were (1)high-resolution atomic force microscopy, (2)molecule deposition with precisely controlled molecular orientation and (3)nanoscale DFM-based measurement techniques for electrical properties of molecules.

动态力显微镜（DFM）及相关技术已经取得了很大的进展。原子力显微镜（AFM）已被证明是一种强大的工具，可以对包括有机分子在内的各种材料进行无损原子分辨率成像，而这些材料通常很难通过扫描隧道显微镜（STM）进行研究。一些基于 AFM 的技术，例如开尔文探针力显微镜 (KFM)，能够研究纳米级的电特性。此外，AFM 探针基本上可以使我们直接访问对象并修改其结构和/或属性。另一方面，由于分子与基材界面处的电极化或局域电场与电结特性或铁电畴的形成密切相关，因此在工程方面理解界面极化的物理起源实际上是必不可少的，特别是在分子偏振控制在分子电子学中的应用。在这个项目中，我们证明了分子偏振的评估和控制是通过新开发的技术进行的，这些技术是（1）高分辨率原子力显微镜，（2）分子偏振精确控制分子取向的沉积和(3)基于纳米级DFM的分子电特性测量技术。

项目成果

Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4x2) superlattice structures of alkanethiol self-assembled monolayers

分子尺度非接触原子力显微镜对比烷硫醇自组装单层 c(4x2) 超晶格结构的形貌和能量耗散

• 发表时间: 2004
• 期刊: Journal of Applied Physics Vol.95 No.3
• 作者: T.Fukuma;T.Ichii;K.Kobayashi;H.Yamada;K.Matsushige
• 通讯作者: K.Matsushige

Hirofumi Yamada: "Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy"Appl.Surf.Sci.. Vol.188. 391-398 (2002)

Hirofumi Yamada：“通过非接触原子力显微镜研究有机分子薄膜的局部结构和电性能”Appl.Surf.Sci.. Vol.188。

Takashi Miyazaki: "Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography"Jpn.J.Appl.Phys.. Vol.41 No.7B. 4948-4951 (2002)

Takashi Miyazaki：“使用电流控制扫描探针光刻技术制造纳米级图案”Jpn.J.Appl.Phys.. Vol.41 No.7B。

Submolecular-Resolution Studies on Metal-Phthalocyanines by Noncontact Atomic Force Microscopy

• DOI: 10.1143/jjap.43.4691
• 发表时间: 2004-07
• 期刊: Japanese Journal of Applied Physics
• 影响因子: 1.5
• 作者: T. Yoda;T. Ichii;T. Fukuma;K. Kobayashi;Hirofumi Yamada;K. Matsushige

True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments

• DOI: 10.1063/1.1852721
• 发表时间: 2005-01-17
• 期刊: APPLIED PHYSICS LETTERS
• 影响因子: 4
• 作者: Fukuma, T;Ichii, T;Matsushige, K
• 通讯作者: Matsushige, K