Development of Method to Separation and Punfication 0f Novel-Fullerene Corn-pound Materials Using Plasma Chromatography

等离子色谱分离纯化0f新型富勒烯复合材料方法的建立

基本信息

批准号：
12680471
负责人：
HIROTA Takamichi
金额：
$ 2.24万
依托单位：
TOHOKU UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
2000
资助国家：
日本
起止时间：
2000 至 2001
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-12680471/
关键词：
Na-C_<60> Plasma Endohedral Metallofullerene Bias Control Method Radial-Deveded Electrodes Control and Separation of Lons in the Plasma Plasma Chromatography フラーレンプラズマ金属内包フラーレンフラーレン誘導体・重合物

项目摘要

The endohedral metallofullerene K@C_<60> was successfully formed by the energy and flux control of K^+ and C^-_<60> ions flowing into substrates in experiments of the thin-film formation with a potassiumfullerene (K^+_-C^-_<60>) plasma. Since the K@C_<60> production ratio to C_<60> was at most 30% and usually 5〜10% or less, however, it was difficult to clarify the relation between the plasma effect and encapsulation mecharuism. From the abovementioned viewpoint, the experiments were carried out by a sodiumfullerene (Na^+_-C^-_<60>) plasma, where the diameter of Na^+ is srmaller than that of K^+. The following results were obtained.According to the mass analysis of thin films formed on the substrates, the large massspectrum peak (Na(@)C_<60>) corresponding to the Naendohedral fullereoe is observed. The average intensity ratio of Na(@)C_<60> to C_<60> is turned out to be 30〜50%. Moreover, the Na(@)C_<60> production ratio to C_<60> in a narrow region of the substrate attains to 200% or more.When the substrate bias is chansed, the average spectrumpeak intensity of Na(@)C_<60> is found to give the maximum value at a specific voltage.The composition and structure of the thin film are directly investigated by the highresolution electron microscope (HREM) observation. A lot of C_<60> molecules with dark shadows around the centers are observed over the image of the thin film in the narrow region of the substrate. The round material imaged by the HREM is considered to be C_<60> encapsulating Na inside the cage, because the Na^+ diameter almost corresponds to the dark shadow diameter.It can be said that a large amount of production of the Na-C_<60> compound materials containing Na@C_<60> facilitates the constituent analysis and structure observation for the purpose of clarifying their physical and chemical properties. This work is also important in the sence of establishing the method of forming fullerenebased thin films with new functions.

在钾富勒烯 (K^+_然而，由于K@C_<60>相对于C_<60>的生成比例最多为30％，通常为5～10％以下。很难阐明等离子体效应与封装机制之间的关系，从上述观点来看，实验是在钠富勒烯（Na^+_-C^-_<60>）等离子体上进行的，其中Na^+的直径。比K^+小得到以下结果。根据在基板上形成的薄膜的质量分析，对应于的大质谱峰(Na(@)C_<60>)。观察到Na(@)C_<60>与C_<60>的平均强度比为30-50％，并且Na(@)C_<60>与C_<60的生成比。 > 在基底的狭窄区域内达到 200% 或更高。当改变基底偏压时，发现 Na(@)C_<60> 的平均谱峰强度给出通过高分辨率电子显微镜（HREM）观察直接研究薄膜的组成和结构。在图像上观察到许多中心周围有暗影的C_<60>分子。 HREM 成像的圆形材料被认为是 C_<60> 将 Na 封装在笼内，因为 Na^+ 直径几乎对应于暗影直径。可以说大量生产含有Na@C_<60>的Na-C_<60>化合物材料有利于成分分析和结构观察，以阐明其物理和化学性质，这项工作对于建立富勒烯基薄膜的形成方法也很重要。具有新功能的薄膜。