Development of Totally Reflected Forced Bayleigh Scattering System and its Application to Molecular Diffusion near Liguid Crystal Substrate Surface

全反射受迫贝利散射系统的研制及其在液晶基板表面附近分子扩散中的应用

• 批准号: 04555013
• 负责人: TAKEZOE Hideo
• 金额: $ 2.56万
• 依托单位: Tokyo Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research (B)
• 财政年份: 1992
• 资助国家: 日本
• 起止时间: 1992 至 1993
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-04555013/
• 关键词: total reflection; Forced Rayleigh scattering; interface; liquid crystal; diffusion; 拡散定数; ネマティック液晶; 強制レーリ散乱; 基板

FRS is a kind of microscopic tracer method based on transient grating (interference fringe ) technique using writing Ar^+ laser beams and a probing He-Ne laser beam. We can determine thediffusion constant of tracer molecules in host liquid crystals accurately and quickly. For the determination of diffusion constants near surface area, i.e., TFRS,we used a total reflection prism as one of a cell surface and the probing beam under a condition of total internal reflection.A preliminary experiment was made for a nematic liquid crystal, 4'-n-pentyl-4-cyanobiphenyl ( 5CB ) . We found that the bulk diffusion shows a nearly single exponential decay. On the other hand, the surface diffusion includes a faster decay component in addition to a decayas same as that of the bulk diffusion. Thus, the surface diffusion is rather faster than the bulk one. Possible explanation is as follows : Surface roughness introduces disorder of molecular alignment and various kinds of defects, which accelerate the diffusion motion. This kind of phenomenon is well known in self-diffusion and impurity diffusion in metals.

FRS是一种基于瞬态光栅（干涉条纹）技术的显微示踪方法，使用写入Ar^+激光束和探测He-Ne激光束。我们可以准确、快速地测定示踪分子在主液晶中的扩散常数。为了测定近表面区域的扩散常数，即TFRS，我们使用全反射棱镜作为池表面和全内反射条件下的探测光束。对向列液晶进行了初步实验，4 '-正戊基-4-氰基联苯 (5CB)。我们发现体扩散表现出几乎单次指数衰减。另一方面，除了与体扩散相同的衰减之外，表面扩散还包括更快的衰减分量。因此，表面扩散比本体扩散快得多。可能的解释如下：表面粗糙度引入了分子排列的无序和各种缺陷，从而加速了扩散运动。这种现象在金属的自扩散和杂质扩散中是众所周知的。

项目成果

T.Moriyama,Y.Takanishi,K.Ishikawa,H.Takezoe and A.Fukuda: "Binary Mass Diffusion in Smectic C and CA Phases as Observed by Forced Rayleigh Scattering" LIq.Cryst.18(印刷中). (1995)

T.Moriyama、Y.Takanishi、K.Ishikawa、H.Takezoe 和 A.Fukuda：“通过受迫瑞利散射观察到的近晶 C 相和 CA 相中的二元质量扩散”LIq.Cryst.18（出版中）。

A.Fukuda,T.Moriyama and H.Takezoe: "Chevron Layer Structure in Smectic Liquid Crystals and Molecular Diffusion near Glass Suface"" New Functionality Materials,Volume C,Synthetic Process and Control of Functionality Materials(Elsevier Science Pub.). 723-72

A.Fukuda，T.Moriyama和H.Takezoe：“近晶液晶中的Chevron层结构和玻璃表面附近的分子扩散””新型功能材料，C卷，功能材料的合成过程和控制（Elsevier Science Pub.）。723

T.Moriyama, Y.Takanishi, K.Ishikawa, H.Takezoe and A.Fukuda: "Binary Mass Diffusion in Smectic C and CA Phases as Observed by Forced Rayleigh Scattering"" Liq.Cryst. ( in press ).

T.Moriyama、Y.Takanishi、K.Ishikawa、H.Takezoe 和 A.Fukuda：“通过强制瑞利散射观察到的近晶 C 和 CA 相中的二元质量扩散”“Liq.Cryst。（正在出版）。

A.Fukuda, T.Moriyama and H.Takezoe: "Chevron Layr Structure in Smectic Liquid Crystals and Molecular Diffusion near Glass Surface" New Functionality Materials, Volume C,Synthetic Process and Control of Functionality Materials ( Elsevier Science Pub.). 723

A.Fukuda、T.Moriyama 和 H.Takezoe：“近晶液晶中的 V 形层结构和玻璃表面附近的分子扩散”新功能材料，C 卷，功能材料的合成过程和控制（Elsevier Science Pub.）。