Characterization of Photoelastic Modulator for Highly Sensitive Instrument for Measuring Optical Birefringence

用于测量光学双折射的高灵敏度仪器的光弹性调制器的表征

• 批准号: 03650719
• 负责人: MAEDA Shiro
• 金额: $ 1.22万
• 依托单位: Fukui University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for General Scientific Research (C)
• 财政年份: 1991
• 资助国家: 日本
• 起止时间: 1991 至 1992
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-03650719/
• 关键词: Photoelastic Modulator; Polarization modulation Spectroscopy; Birefringence; 複屈析

1. High performance photoelastic modulator (PEM) was made whose thickness is one half of an conventional one. A dynamic residual birefringence in optical element of PEM makes artifact signals combining with non-ideality of other optical elements, detector, and lock-in amplifier. Therefore, PEM whose optical element has small dynamic birefringence must be used. We succeeded in measuring correct circular dichroism spectra of standard samples from ultra violet to visible light range by using our new type PEM.2. Automatic measuring system for measurements of admittance parameters of PEM was made. IBM PC/XT, LCR meter, and frequency synthesizer are combined with GP-IB. Data analyses are made on IBM PC/AT compatible personal computer by using RS/I, which is high performance software for scientific data analysis.

1. 制成高性能光弹调制器（PEM），其厚度为传统光弹调制器的二分之一。 PEM光学元件中的动态残余双折射使得伪信号与其他光学元件、探测器和锁定放大器的非理想性相结合。因此，必须使用动态双折射小的光学元件的PEM。通过使用我们的新型 PEM.2，我们成功地测量了从紫外线到可见光范围内的标准样品的正确圆二色光谱。研制了质子交换膜导纳参数自动测量系统。 IBM PC/XT、LCR 表和频率合成器与 GP-IB 结合在一起。数据分析是在IBM PC/AT兼容的个人计算机上使用RS/I进行的，RS/I是用于科学数据分析的高性能软件。