ATOM MAMIPULATION AND EVALUATION OF PROBING TIPS

原子操纵和探测尖端的评估

基本信息

  • 批准号:
    05245107
  • 负责人:
  • 金额:
    $ 87.42万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research on Priority Areas
  • 财政年份:
    1993
  • 资助国家:
    日本
  • 起止时间:
    1993 至 1996
  • 项目状态:
    已结题

项目摘要

The main subjects of this research on priority areas are the clarification of tunneling mechanism of electrons tunneling utilizing various high resolution microscoppies such as field emission microscopy (FEM), field ion microscopy (FIM) and scanning tunneling microscopy (STM). The electronic states of surfaces are investigated by scanning tunneling spectroscopy (STS) and field emission electron spectroscopy (FEES). However, it has been realized that the tunneling probability between a surface atom and an apex atom of a scanning tip of STM varies with the electronic state and atomic arrangement of the apex. Accordingly, the major aim of this research division is atomic level inspection of the constituent distributions of tip apexes with an atom probe (AP) and of electronic state with FEES and STS.The mechanism of atom manipulation is also studied FIM and STM.Results of this research are listed below.(1) The FEM/FIM which can introduce imaging plates (IP) was constructed in order to investigate the tunneling probability quantitatively.(2) A scanning atom probe (SAP) was developed to mass analyze 2-dimensional specimen surfaces. The mass analysis of artificially made diamond was mass analyzed.(3) High resolution FEES was constructed and detected the atomic and lattice vibrations at the tip apex were detected at 4K.(4) The electronic states of semicondutor surfaces were controlled by depositing foreign atoms to lattice steps utilizing atom manipulation technique.(5) Tunneling characteristics of phtalocyanines was investigated examining the binding state with the substrate and measuring I-V curves.(6) Self-organized quantum dot structures formed in GaP/InP short period superlattices were investigated by STM/STS.
这项优先领域研究的主要课题是利用场发射显微镜(FEM)、场离子显微镜(FIM)和扫描隧道显微镜(STM)等各种高分辨率显微镜阐明电子隧道的隧道机制。通过扫描隧道光谱(STS)和场发射电子光谱(FEES)研究表面的电子态。然而,人们已经认识到,STM扫描尖端的表面原子和顶点原子之间的隧道概率随着顶点的电子态和原子排列而变化。因此,该研究部门的主要目标是用原子探针 (AP) 对尖端顶点的成分分布进行原子水平检查,并用 FEES 和 STS 对电子态的成分分布进行原子水平检查。还研究了 FIM 和 STM 原子​​操纵的机制。 (1)构建了可引入成像板(IP)的FEM/FIM以定量研究隧道概率。(2)开发了扫描原子探针(SAP)以对二维进行质量分析标本表面。对人造金刚石进行了质量分析。(3)构建了高分辨率FEES​​并在4K下检测了尖端顶点的原子和晶格振动。(4)通过沉积外来原子控制半导体表面的电子态(5)研究了酞菁的隧道特性,检查与基底的结合状态并测量I-V曲线。(6)在中形成的自组织量子点结构通过 STM/STS 研究了 GaP/InP 短周期超晶格。

项目成果

期刊论文数量(83)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
0.Nishikawa: "Development of a Scanning Atom Probe" to be published in J.Vac.Sci.TechnolB. 13. (1995)
0.Nishikawa:“扫描原子探针的开发”将在 J.Vac.Sci.TechnolB 上发表。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
G.M.McClelland and F.Watanabe: "Field Emission Switch" Appl.Phys.Lett.67. 3200-3202 (1995)
G.M.McClelland 和 F.Watanabe:“场发射开关”Appl.Phys.Lett.67。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
H.Morikawa: "A Field Ion Microscope Study on Vapor Deposition of Copper on Tungsten" Thin Solid films. 254. 103-110 (1995)
H.Morikawa:“场离子显微镜研究铜在钨上的气相沉积”固体薄膜。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
K.Uesugi: "Adsorption and Desorption of AlCl_3 on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Micrsocopy" Jpn.J.Appl.Phys.32. 6200-6202 (1993)
K.Uesugi:“通过扫描隧道显微镜和原子力显微镜观察到 AlCl_3 在 Si(111)7×7 上的吸附和解吸”Jpn.J.Appl.Phys.32 (1993)。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
O.Nishikawa,M.Iwatsuki,S.Aoki and Y.Ishikawa: "Performance of the Trial Scanning Atom Probe -A New Approach to Evaluate the Micro Tip Apex-" J.Vac.Sci.Technol.B. 14. 2110-2113 (1996)
O.Nishikawa、M.Iwatsuki、S.Aoki 和 Y.Ishikawa:“试验扫描原子探针的性能 - 评估微尖端尖端的新方法 -”J.Vac.Sci.Technol.B。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

数据更新时间:{{ journalArticles.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ monograph.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ sciAawards.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ conferencePapers.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ patent.updateTime }}

NISHIKAWA Osamu其他文献

NISHIKAWA Osamu的其他文献

{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

{{ truncateString('NISHIKAWA Osamu', 18)}}的其他基金

Investigation of stress field and pulverization mechanism at the fault rapture front propagating at a high speed
高速传播断层破裂前缘应力场及粉碎机制研究
  • 批准号:
    23654170
  • 财政年份:
    2011
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Evaluation of the residual stress on the fault plane by stick slip experiment and high resolution observation of slip plane
粘滑实验及滑移面高分辨率观测评价断层面残余应力
  • 批准号:
    20540442
  • 财政年份:
    2008
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Atomic Level Study of Photo-Stimulated Field Emission from Insulating Thin Layers Utilizing the Scanning Atom Probe
利用扫描原子探针进行绝缘薄层光激场发射的原子水平研究
  • 批准号:
    09450023
  • 财政年份:
    1997
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
TUNNELING CHARACTERISCITCS OF INDIVIDUAL SURFACE ATOMS
单个表面原子的隧道特性
  • 批准号:
    05245106
  • 财政年份:
    1997
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Scientific Research on Priority Areas
Study on the Advancement of the Geographic Information Science (GIS) and the Organization for the GIS Education and Research
地理信息科学的发展及GIS教育与研究的组织研究
  • 批准号:
    06306012
  • 财政年份:
    1994
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Development of Field Emission Type Ultra-High Vacuum Gauge
场发射型超高真空计的研制
  • 批准号:
    02555009
  • 财政年份:
    1990
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research (B)
Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-P
STM 和 A-P 组合仪器进行超精细表面分析
  • 批准号:
    01460211
  • 财政年份:
    1989
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Ultramicroanalysis of Conducting Polymers with Atom-Probe
用原子探针对导电聚合物进行超微量分析
  • 批准号:
    61460062
  • 财政年份:
    1986
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Ultra-Microscopic Analysis of Metal-Compound Semiconductor Interfaces by the Atom-Probe Mass Analyzer
利用原子探针质量分析仪对金属化合物半导体界面进行超显微分析
  • 批准号:
    59420038
  • 财政年份:
    1984
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (A)

相似海外基金

TUNNELING CHARACTERISCITCS OF INDIVIDUAL SURFACE ATOMS
单个表面原子的隧道特性
  • 批准号:
    05245106
  • 财政年份:
    1997
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Scientific Research on Priority Areas
Construction of a three dimensional atom probe and its applications to materials research
三维原子探针的构建及其在材料研究中的应用
  • 批准号:
    04555154
  • 财政年份:
    1992
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research (B)
development of field ion-magnetic force microscope (FI-MFM) and its application to surface magnetism
场离子磁力显微镜(FI-MFM)的研制及其在表面磁性中的应用
  • 批准号:
    03402006
  • 财政年份:
    1991
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (A)
Development of Preparation Methods of SXM Tips with a Ultra-fine Probing Area
具有超精细探测区域的 SXM 探针制备方法的开发
  • 批准号:
    02555004
  • 财政年份:
    1990
  • 资助金额:
    $ 87.42万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research (B)
{{ showInfoDetail.title }}

作者:{{ showInfoDetail.author }}

知道了