Development of Thermal Radiation Spectroscopy Technique for Diagnosis of Thermal Radiation Phenomena and Microstructure of Surfaces

热辐射现象和表面微观结构诊断的热辐射光谱技术的发展

基本信息

批准号：
13555054
负责人：
MAKINO Toshiro
金额：
$ 8.38万
依托单位：
KYOTO UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
2001
资助国家：
日本
起止时间：
2001 至 2002
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-13555054/
关键词：
Spectroscopic Measurement Thermal Radiation Property Radiative Heat Transfer In-process Measurement Surface Diagnosis Radiation Pyrometry Surface Roughness Surface Films インプロセス計測

项目摘要

Surfaces in industrial environments are far different from clean optically smooth surfaces in laboratories. The surfaces are microscopically rough and covered by any surface films. Also, in the surface processings, surface micro-geometry is realized and films are grown on the surfaces. The surface micro structure is changed at every second in the industrial environments. The targets of this study are, first, to clarify the thermal radiation characteristics of such surfaces for heat transfer evaluation, and second, to develop a thermal radiation technique for diagnosing the surface microstructure. Hard- and soft-wares are presented.In 2001/2002, we had developed a wide-wavelength range high-speed spectrophotometer system. It is the main hard-ware system for our study. It measures the spectra of reflection and emission of radiation of 93 wavelength points in a 0.3-11μm wavelength range simultaneously and repeatedly by a cycle time of 2s. The effective performance of this system is demons … More trated in the thermal radiation characteristic study on metals. In 2002/2003, on the basis of this hard-ware, we presented an algorithm for analyzing the reflection and emission spectra of surfaces measured at every second to diagnose the temperature, micro-roughness and film thickness of the surfaces at every second. The performance of the algorithm was demonstrated by experimental examinations. By the algorithm, the temperature is estimated optically without the information of the surface emittance which is changing due to the change in the surface microstructure. The root-mean-squares roughness of the diffuse-reflecting surfaces of radiation is estimated separately from the self-correlation length of the rough surface structure. The present technique can be a strong technique for the non-contact in-process diagnosis of temperature and microstructure of surfaces. In the present study, it was also confirmed that the emission of the surface film systems is characterized by the interference of radiation. This finding suggests that we have a possibility to develop a new functional radiation energy source which emits radiation of a certain wavelength in a certain direction. Less

工业环境中的表面与实验室中干净的光学光滑表面有很大不同，这些表面在微观上是粗糙的并且被任何表面薄膜覆盖。此外，在表面处理中，实现了表面微观几何形状并在表面上生长了薄膜。在工业环境中每秒都在变化。这项研究的目标首先是阐明此类表面的热辐射特性以进行传热评估，其次是开发一种用于诊断表面微观结构的热辐射技术。和2001/2002年，我们开发了宽波长范围高速分光光度计系统，它是我们研究的主要硬件系统，它测量93个波长的辐射的反射和发射光谱。该系统的有效性能在金属热辐射特性研究中得到了证明。 2002/2003年，在此硬件的基础上，我们提出了一种分析每秒测量的表面反射和发射光谱的算法，以诊断每秒表面的温度、微观粗糙度和薄膜厚度。通过实验检查证明了该算法，在没有由于表面微结构变化而变化的表面发射率的情况下光学估计温度。辐射的自相关长度与粗糙表面结构的自相关长度分开估计，本技术可以成为表面温度和微观结构的非接触过程诊断的强大技术。表面薄膜系统的发射特征是辐射的干涉，这一发现表明我们有可能开发出一种新的功能性辐射能源，它可以在特定方向上发射特定波长的辐射。