Development of Thermal Radiation Spectroscopy Technique for Diagnosis of Thermal Radiation Phenomena and Microstructure of Surfaces

热辐射现象和表面微观结构诊断的热辐射光谱技术的发展

基本信息

批准号：
13555054
负责人：
MAKINO Toshiro
金额：
$ 8.38万
依托单位：
KYOTO UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
2001
资助国家：
日本
起止时间：
2001 至 2002
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-13555054/
关键词：
Spectroscopic Measurement Thermal Radiation Property Radiative Heat Transfer In-process Measurement Surface Diagnosis Radiation Pyrometry Surface Roughness Surface Films インプロセス計測

项目摘要

Surfaces in industrial environments are far different from clean optically smooth surfaces in laboratories. The surfaces are microscopically rough and covered by any surface films. Also, in the surface processings, surface micro-geometry is realized and films are grown on the surfaces. The surface micro structure is changed at every second in the industrial environments. The targets of this study are, first, to clarify the thermal radiation characteristics of such surfaces for heat transfer evaluation, and second, to develop a thermal radiation technique for diagnosing the surface microstructure. Hard- and soft-wares are presented.In 2001/2002, we had developed a wide-wavelength range high-speed spectrophotometer system. It is the main hard-ware system for our study. It measures the spectra of reflection and emission of radiation of 93 wavelength points in a 0.3-11μm wavelength range simultaneously and repeatedly by a cycle time of 2s. The effective performance of this system is demons … More trated in the thermal radiation characteristic study on metals. In 2002/2003, on the basis of this hard-ware, we presented an algorithm for analyzing the reflection and emission spectra of surfaces measured at every second to diagnose the temperature, micro-roughness and film thickness of the surfaces at every second. The performance of the algorithm was demonstrated by experimental examinations. By the algorithm, the temperature is estimated optically without the information of the surface emittance which is changing due to the change in the surface microstructure. The root-mean-squares roughness of the diffuse-reflecting surfaces of radiation is estimated separately from the self-correlation length of the rough surface structure. The present technique can be a strong technique for the non-contact in-process diagnosis of temperature and microstructure of surfaces. In the present study, it was also confirmed that the emission of the surface film systems is characterized by the interference of radiation. This finding suggests that we have a possibility to develop a new functional radiation energy source which emits radiation of a certain wavelength in a certain direction. Less

工业环境中的表面与实验室的光滑光滑表面有很大不同。表面在显微镜上是粗糙的，并被任何表面膜覆盖。同样，在表面加工中，表面微观几何体现出，并且在表面上生长膜。在工业环境中，每一秒都会更改表面微观结构。这项研究的目标首先是为了阐明此类表面的热辐射特性进行传热评估，其次是开发用于诊断表面微观结构的热辐射技术。提出了硬件和软件软件。在2001/2002中，我们开发了宽波长的高速分光光度计系统。这是我们研究的主要硬件系统。它可以轻松，反复反复地在2s的周期时间内轻松，反复地测量93波长点的反射和发射光谱。该系统的有效性能是恶魔……在金属的热辐射特性研究中更加表现。在2002/2003年，根据此硬件，我们提出了一种算法，用于分析每秒测量的表面的反射和发射光谱，以诊断每秒每秒的温度，微冲突和膜厚度。通过实验检查证明了该算法的性能。通过算法，温度是光学估计的，而没有表面微观结构变化而发生的表面发射信息。辐射的弥漫性反射表面的根平方与粗糙表面结构的自相关长度分开估计。目前的技术可能是对表面温度和微观结构的非接触式诊断的强大技术。在本研究中，还证实了表面膜系统的发射以辐射的干扰为特征。这一发现表明，我们有可能开发一种新的功能辐射能源，该功能辐射能源在某个方向上排放一定波长的辐射。较少的