lASER FORCE SPECTROSCOPY OF SINGLE NANO-ASSEMBLIES

单个纳米组件的激光光谱

• 批准号: 13450024
• 负责人: SASAKI Keiji
• 金额: $ 9.54万
• 依托单位: HOKKAIDO UNIVERSITY
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2002
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-13450024/
• 关键词: Nanoparticles; Radiation pressure; Laser manipulation; Light scattering; Transient absorption; Nanometer position sensing; Potential measurement; 過度吸収

A novel method of dynamic absorption spectroscopy with using laser radiation pressure has been developed for analyzing photophysical phenomena of single nano-assemblies with high sensitivity and high precision. This method is based on a fact that the radiation pressure induced by irradiation of laser light depends on the refractive index and the absorption coefficient (complex refractive index) of the assembly. That is an original idea that absorption is measured through conversion into an optical force, instead of the change in the transmission light intensity. Thus, there is no influence of scattering and stray lights, and high sensitivity can be obtained for linear absorption measurement, those are advantages to the conventional spectroscopy techniques. In the method, our original technique that makes it possible to directly measure an extremely weak force exerted on a Brownian nano-assembly by statistical mechanics is used. This technique can realize femto-Newton order force observation so that assemblies with absorption cross sections of square Angstrom could be analyzed. We have developed a laser force spectroscopy system with a laser-diode-pumped Nd : YAG laser and originally designed microscope optics. Theoretical analyses and experimental date obtained for dye-doped polymer latexes demonstrated the effectiveness of the method, and we discussed on the expectation of sensitivity and precision in the present technique.

开发了一种利用激光辐射压的动态吸收光谱的新方法，用于高灵敏度和高精度分析单个纳米组件的光物理现象。该方法基于以下事实：由激光照射引起的辐射压力取决于组件的折射率和吸收系数（复折射率）。这是一个原始想法，通过转换成光学力来测量吸收，而不是通过透射光强度的变化来测量。因此，不受散射和杂散光的影响，线性吸收测量可以获得高灵敏度，这些都是传统光谱技术的优点。在该方法中，使用了我们的原创技术，该技术可以通过统计力学直接测量施加在布朗纳米组件上的极弱力。该技术可以实现飞牛顿级的力观测，从而可以分析具有平方埃吸收截面的组件。我们开发了一种激光力谱系统，配备激光二极管泵浦 Nd : YAG 激光器和原创设计的显微镜光学器件。对染料掺杂聚合物乳胶的理论分析和实验数据证明了该方法的有效性，并讨论了本技术的灵敏度和精度的预期。

项目成果

H.Fujiwara: "Observation of the discrete transition of optically trapped particle position in the vicinity of an interface"Appl.Phys.Lett.. 84, 1. 13-15 (2004)

H.Fujiwara：“界面附近光学捕获粒子位置离散转变的观察”Appl.Phys.Lett.. 84, 1. 13-15 (2004)

K.Sasaki: "Single Organic Nanoparticles, Chap. 9 : Force measurement for a single nanoparticle, (Eds.; H.Masuhara, H.Nakanishi, K.Sasaki"Springer. 109-120 (2003)

K.Sasaki：“单一有机纳米粒子，第 9 章：单个纳米粒子的力测量，（编辑；H.Masuhara、H.Nakanishi、K.Sasaki”Springer. 109-120 (2003)

K.Wada: "Electric charge measurement on a single microparticle using thermodynamic analysis of electrostatic forces"Appl. Phys. Lett.. 81, 10. 1768-1770 (2002)

K.Wada：“利用静电力热力学分析对单个微粒进行电荷测量”Appl。

K.Tsujino: "A detailed analysis of the fidelity of quantum teleportation using photons : Considering real experimental parameters"Physical Review A. 66. 042314-1-042314-6 (2002)

K.Tsujino：“使用光子的量子隐形传态保真度的详细分析：考虑真实的实验参数”物理评论 A. 66. 042314-1-042314-6 (2002)

K.Wada: "Electric charge measurement on a single microparticle using thermodynamic analysis of electrostatic forces"Appl. Phys. Lett.. 81,10. 1768-1770 (2003)

K.Wada：“利用静电力热力学分析对单个微粒进行电荷测量”Appl。