Measurement of single-molecular conductivity

单分子电导率的测量

• 批准号: 13450023
• 负责人: MATSUMOTO Takuya
• 金额: $ 8.96万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2003
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-13450023/
• 关键词: Conductivity of single molecule; Non-contact atomic force microscopy; Scanning tunneling microscopy; Point-contact current-imaging atomic force microscopy; Charge transfer microscopy; Carbon nano-tube; Porphyrin array; DNA; 電荷移動; レベルシフト; スタック角度

Molecular electronics has attracted much attention in the last quarter-century. Investigations on the electronic properties and functions of molecular systems have made remarkable advances since the invention of scanning tunneling microscopy (STM). However, STM measurement is inadequate for the device structure consisting of conductive and insulating parts due to the requirement of conductivity for all over the scanning area. In this study, novel methods of scanning probe microscopy based on atomic force microscopy (AFM). These methods enable us to evaluate electronic properties of molecular nanostructures located on insulating substrates and/or connected with metal electrodes.1.Non-contact atomic force microscopy (NC-AFM) has been employed to observe double-stranded DNA. The simultaneous measurements of frequency-shift and tunneling current indicate that DNA molecules show tunneling conductivity with the. attenuation factor β=1.1Å^<-1>.2.Point-contact current-imaging atomic force micr … More oscopy (PCI-AFM) enables us to obtain topographic images and current-voltage characteristics simultaneously in nanoscale. PCI-AFM is a combined method with two different measurement techniques : tapping-mode scan and point-contact measurement. This new technique will be a good approach to obtain the relationship between topography and electrical properties of individual nanoscale structures.3.Charge transfer force microscopy/ spectroscopy (CTFM/S) detects the energy dissipation of cantilever oscillation with constant tip-sample distance under bias voltage. It enables us to obtain a map of density of states (DOS) and DOS spectra in manometer-scale resolution for the surface consisting of insulating and conductive parts. CTFM images and CTFS spectra are obtained by probing frequency shift of cantilever oscillation. Figure 1 shows CTFS spectra as a function of bias voltage for 5, 10, 15, 20-tetraphenyl-21H, 23H-porphine tetrasulfonic acid (TPPS). HOMO-LUMO gap (1.7eV) is observed clearly on an insulating substrate. Less

自从扫描隧道显微镜 (STM) 发明以来，分子电子学在过去 25 年中引起了人们的广泛关注，对分子系统的电子特性和功能的研究取得了显着的进展。由于整个扫描区域都需要导电性，因此我们使用基于原子力显微镜 (AFM) 的扫描探针显微镜新方法来评估导电和绝缘零件的电子特性。位于绝缘基底上和/或与金属电极连接的分子纳米结构。1.采用非接触原子力显微镜(NC-AFM)观察双链DNA，同时测量频移和隧道电流表明DNA。分子显示出隧道电导率，衰减系数 β=1.1Å^<-1>.2。点接触电流成像原子力显微镜 … 更多显微镜PCI-AFM（PCI-AFM）使我们能够同时获得纳米尺度的形貌图像和电流-电压特性，它是一种结合了两种不同测量技术的方法：轻敲模式扫描和点接触测量，这种新技术将是一种很好的技术。获得单个纳米级结构的形貌与电性能之间关系的方法。3.电荷转移力显微镜/光谱学（CTFM/S）检测恒定尖端样品悬臂振荡的能量耗散它使我们能够获得由绝缘和导电部件组成的表面的态密度 (DOS) 和 DOS 谱分辨率，CTFM 图像和 CTFS 谱是通过探测悬臂梁的频移获得的。图 1 显示了 5, 10, 15, 20-四苯基-21H, 23H-卟啉的 CTFS 光谱与偏置电压的函数关系。在绝缘基板上可以清楚地观察到四磺酸（TPPS）。

项目成果

Katsunori Tagami, Takuya Matsumoto, Tomoji Kawai, Tasaru Tsukada: "Theoretical prescriptions for improving conductance of short DNA segments sandwiched between metal electrode"Jpn.J.Appl.Phys.. 42. 5887 (2003)

Katsunori Tagami、Takuy​​a Matsumoto、Tomoji Kawai、Tasaru Tsukada：“改善夹在金属电极之间的短 DNA 片段电导的理论处方”Jpn.J.Appl.Phys.. 42. 5887 (2003)

T.Matsumoto, T.Yokoyama, T.Kawai: "Chemistry of Nanomolecular systems-towards the realization of nanomolecular devices"Springer-Verlag. 107-121 (2002)

T.Matsumoto、T.Yokoyama、T.Kawai：“纳米分子系统的化学——迈向纳米分子器件的实现”施普林格出版社。

Yasushi Maeda, Hidehiro Nishijima, Seiji Akita, Takuya Matsumoto, Yoshikazu Nakayama, Tomoji Kawai: "Reduction of Long-range Interaction using Carbon Nanotube Probes in Biological Systems."Jpn.J.Appl.Phys.. 40. 1425-1428 (2001)

Yasushi Maeda、Hidehiro Nishijima、Seiji Akita、Takuy​​a Matsumoto、Yoshikazu Nakayama、Tomoji Kawai：“在生物系统中使用碳纳米管探针减少长程相互作用。”Jpn.J.Appl.Phys.. 40. 1425-1428 (2001)

松重和美, 田中一義 編 (分担:松本卓也, 川合知二): "化学フロンティア6「分子ナノテクノロジー」SPMによるナノ物質の電気伝導度測定"化学同人. 12(53-64) (2002)

Kazumi Matsushige、Kazuyoshi Tanaka（编辑：Takuy​​a Matsumoto、Tomoji Kawai）：“Chemical Frontier 6“分子纳米技术”通过 SPM 测量纳米材料的电导率” Kagaku Doujin 12（53-64）（2002）。

R.Akiyama, H.Tanaka, T.Matsumoto, T.Kawai: "Spin-polarized scanning tunneling microscopy on half-metallic manganite thin film with half-megallic manganite tip"Appl. Phys. Lett.. 79. 4378 (2001)

R.Akiyama、H.Tanaka、T.Matsumoto、T.Kawai：“半金属锰酸锰薄膜上的自旋偏振扫描隧道显微镜，具有半巨锰酸锰尖”Appl。