Raman microscope for tip-enhanced Raman scattering (TERS)

用于尖端增强拉曼散射 (TERS) 的拉曼显微镜

• 批准号: 447264071
• 金额: --
• 依托单位: Friedrich-Alexander-Universität Erlangen-Nürnberg
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2020
• 资助国家: 德国
• 起止时间: 2019-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/447264071?language=en
• 关键词: Raman; microscope; tip; enhanced; scattering

In order to perform optical spectroscopy on the nanometer scale, we request a setup for tip-enhanced Raman scattering (TERS). By combination of a scanning-probe microscope with a Raman spectrometer, TERS allows to record optical spectra with a spatial resolution of 10-100 nm. We plan to use this method for investigating the physical properties of low-dimensional materials such as two-dimensional (2D) semiconductors, graphene, and carbon nanotubes. Our aim is to obtain local spectroscopic information about the physical properties and their potential modifications by defects, chemical functionalization, crystallographic orientation and stacking order in few-layer 2D materials. In particular, stacking of atomically thin 2D materials like graphene or transition-metal dichalcogenides can result in a moiré superlattice due to mismatch of lattice constants or twist angle between the layers. This moiré structure modulates the optical and electronic properties with a length scale of approximately 10-20 nm. TERS is ideally suited to investigate the optical and structural properties of moiré-induced effects as well as other local modifications of 2D materials and carbon nanotubes. This advanced method thus offers new insights into the physical properties of low-dimensional materials beyond conventional optical spectroscopy.

为了在纳米尺度上进行光谱分析，我们需要一种尖端增强拉曼散射 (TERS) 装置。通过将扫描探针显微镜与拉曼光谱仪相结合，TERS 可以记录空间分辨率为 10 的光谱。 -100 nm。我们计划使用这种方法来研究二维（2D）半导体、石墨烯和碳纳米管等低维材料的物理性质。关于少层二维材料中的物理特性及其潜在的缺陷、化学功能化、晶体取向和堆叠顺序的修改的光谱信息特别是原子薄二维材料（如石墨烯或过渡金属二硫属化物）的堆叠可以产生莫尔超晶格。由于层之间的晶格常数或扭曲角不匹配，这种莫尔结构以大约 10-20 的长度尺度调节光学和电子特性。 nm. TERS 非常适合研究莫尔效应的光学和结构特性以及二维材料和碳纳米管的其他局部修饰，因此这种先进方法为传统光学之外的低维材料的物理特性提供了新的见解。光谱学。