In situ Atomic Force Microscope (in situ AFM)

原位原子力显微镜（原位AFM）

• 批准号: 445052562
• 金额: --
• 依托单位: Technische Universität Dortmund
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2020
• 资助国家: 德国
• 起止时间: 2019-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/445052562?language=en
• 关键词: situ; Atomic; Force; Microscope; AFM

The in situ Atomic Force Microscope (in situ AFM) will be used in combination with the available Focused Ion Beam Scanning Electron Microscope (FIB-SEM, Zeiss Crossbeam 550L) in ongoing and planned research projects as well as in interdisciplinary and international research cooperations, with the aim to describe the mechanisms of microstructure-based physical-mechanical material behavior. It is of particular importance to undertake meticulous studies on the relationship between microstructure properties, and deformation and damage behavior. The aim is to obtain the most comprehensive information from all microstructural levels and to link it with data from mechanical and technological investigations, and describe it qualitatively and quantitatively. The in operando acquired data from mechanical tests, which are based on physical material reactions during loading and measured using thermal, electrical, micromagnetic, optical and acoustic sensors are particularly valuable. In order to relate these physical characteristics to the microstructure, investigations using light and scanning electron microscopy must be enhanced by scanning atomic force microscopy. With the help of in situ AFM characterization, all the local topographic, microstructural, micromechanical, electrical, micromagnetic and corrosive properties under mechanical-thermal-corrosive loading can be precisely measured and linked with the in operando determined material and component properties for understanding of a process-structure-propertyrelashionship. A combination with available SEM methods such as EDX and EBSD analyses as well as 3D characterization by means of FIB-SEM, allow a simultaneous and holistic property description of microstructural elements, that will also be used for modeling and simulation. As a result of this significant gain in knowledge, the microstructure-based mechanisms of material behavior will be investigated scientifically in situ and linked to the macroscopic properties by creating accurate models of deformation, damage and service life.

原位原子力显微镜（原位AFM）将与正在进行和计划的研究项目以及跨学科和国际研究合作中的可用聚焦离子束扫描电子显微镜（FIB-SEM，Zeiss Crossbeam 550L）结合使用，旨在描述基于物理机制物质物质的机制。对微观结构特性以及变形和损害行为之间关系的细致研究特别重要。目的是从所有微观结构级别获取最全面的信息，并将其与机械和技术研究中的数据联系起来，并在定性和定量上描述其。 Opando从机械测试中获取了数据，这些数据基于加载过程中的物理材料反应，并使用热，电气，微磁性，光学传感器和声学传感器进行测量。为了将这些物理特征与显微结构相关联，必须通过扫描原子力显微镜来增强使用光和扫描电子显微镜的研究。借助原位AFM表征，在机械热腐蚀性载荷下，所有局部地形，微结构，微型机械，电气，微型和腐蚀性和腐蚀性都可以精确测量并与操作中的Operando确定的材料和成分特性相关，以了解过程结构结构构建过程。与可用的SEM方法（例如EDX和EBSD分析）以及通过FIB-SEM进行3D表征的组合，允许对微结构元素的同时且整体属性描述，也将用于建模和仿真。由于知识的显着增长，基于微观结构的物质行为机制将进行科学研究，并通过创建准确的变形，损坏和使用寿命的模型来与宏观特性联系起来。