In situ Atomic Force Microscope (in situ AFM)

原位原子力显微镜（原位AFM）

• 批准号: 445052562
• 金额: --
• 依托单位: Technische Universität Dortmund
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2020
• 资助国家: 德国
• 起止时间: 2019-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/445052562?language=en
• 关键词: situ; Atomic; Force; Microscope; AFM

The in situ Atomic Force Microscope (in situ AFM) will be used in combination with the available Focused Ion Beam Scanning Electron Microscope (FIB-SEM, Zeiss Crossbeam 550L) in ongoing and planned research projects as well as in interdisciplinary and international research cooperations, with the aim to describe the mechanisms of microstructure-based physical-mechanical material behavior. It is of particular importance to undertake meticulous studies on the relationship between microstructure properties, and deformation and damage behavior. The aim is to obtain the most comprehensive information from all microstructural levels and to link it with data from mechanical and technological investigations, and describe it qualitatively and quantitatively. The in operando acquired data from mechanical tests, which are based on physical material reactions during loading and measured using thermal, electrical, micromagnetic, optical and acoustic sensors are particularly valuable. In order to relate these physical characteristics to the microstructure, investigations using light and scanning electron microscopy must be enhanced by scanning atomic force microscopy. With the help of in situ AFM characterization, all the local topographic, microstructural, micromechanical, electrical, micromagnetic and corrosive properties under mechanical-thermal-corrosive loading can be precisely measured and linked with the in operando determined material and component properties for understanding of a process-structure-propertyrelashionship. A combination with available SEM methods such as EDX and EBSD analyses as well as 3D characterization by means of FIB-SEM, allow a simultaneous and holistic property description of microstructural elements, that will also be used for modeling and simulation. As a result of this significant gain in knowledge, the microstructure-based mechanisms of material behavior will be investigated scientifically in situ and linked to the macroscopic properties by creating accurate models of deformation, damage and service life.

原位原子力显微镜（原位 AFM）将与现有的聚焦离子束扫描电子显微镜（FIB-SEM、Zeiss Crossbeam 550L）结合使用，用于正在进行和计划的研究项目以及跨学科和国际研究合作，旨在描述基于微观结构的物理机械材料行为的机制。对微观结构特性与变形和损伤行为之间的关系进行细致的研究尤为重要。目的是从所有微观结构层面获得最全面的信息，并将其与机械和技术研究的数据联系起来，并定性和定量地描述它。从机械测试中获取的操作数据特别有价值，这些数据基于加载过程中的物理材料反应，并使用热、电、微磁、光学和声学传感器进行测量。为了将这些物理特征与微观结构联系起来，必须通过扫描原子力显微镜来增强使用光学和扫描电子显微镜的研究。借助原位 AFM 表征，可以精确测量机械-热-腐蚀载荷下的所有局部形貌、微观结构、微机械、电学、微磁和腐蚀特性，并将其与操作中确定的材料和组件特性联系起来，以了解过程-结构-属性的关系。与可用的 SEM 方法（例如 EDX 和 EBSD 分析）以及 FIB-SEM 的 3D 表征相结合，可以对微观结构元素进行同步和整体的属性描述，这也将用于建模和模拟。由于知识方面取得了重大进展，基于微观结构的材料行为机制将得到现场科学研究，并通过创建准确的变形、损伤和使用寿命模型将其与宏观特性联系起来。