MRI: Acquisition of a Hard X-ray PhotoElectron Spectroscopy (HAXPES) for the Institute for Materials Research (IMR) at Binghamton University (BU)

MRI：为宾厄姆顿大学 (BU) 材料研究所 (IMR) 购买硬 X 射线光电子能谱 (HAXPES)

基本信息

批准号：
1919704
负责人：
Louis Piper
金额：
$ 123.2万
依托单位：
SUNY at Binghamton
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2019
资助国家：
美国
起止时间：
2019-09-01 至 2022-08-31
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=1919704&HistoricalAwards=false
关键词：
MRI Acquisition Hard ray PhotoElectron

项目摘要

The chemical and electronic properties of a solid can be measured non-destructively by analyzing the velocity of escaping electrons ejected from the material excited by X-rays. For most commercial laboratory-based soft X-ray sources, the majority of escaping electrons come from the topmost layers of the material making it a sensitive probe of the surface chemistry. Although surfaces are extremely important for many applications in catalysts and electronic devices, the chemistry at the surface is often distinctly different from the bulk underneath. Employing harder X-rays increases the percentage of electrons escaping from deeper within the material, but such bulk studies have thus far been limited to dedicated National facilities. Recent advances in new high-performance hard X-ray sources and detectors enable comparable bulk-sensitive measurements within a university laboratory setting thereby presenting a cost-effective means of increasing access to this emerging technique. The increased non-destructive chemical depth-profiling enables new insight into how buried layers within real device architectures evolve during operation, such as transistors, solar cells and batteries. The new instrument is accessible for academic and industry users across the U.S.A. The project integrates the instrument into various existing recruitment and educational programs at Binghamton University for increasing STEM retention and developing the workforce in next-generation technologies for energy harvesting, storage and efficiency.This project provides a novel laboratory-based HArd X-ray Photoelectron Spectroscopy (HAXPES) system for non-destructive chemical analysis of real materials and devices at Binghamton University. HAXPES studies at Synchrotron facilities are capable of precise chemical and electronic measurements at previously inaccessible regions of real materials and devices. The laboratory-based HAXPES instrument consists of a novel monochromatic Ga K-edge liquid jet x-ray source (9.25 KeV) enabling core and valence band studies with sampling depths up to 60 nm. This instrument dramatically increases access to this technique beyond the handful of Synchrotron-based HAXPES systems currently operational worldwide. Working with Federally funded centers at Binghamton and partnering institutions across the U. S. A. (both academic and industrial) this project is developing in-situ and operando HAXPES capabilities for studying active layers and buried contacts within next-generation transistors and (photo-)electrochemical cells during their operation. The HAXPES instrument is housed in a dedicated user facility for access to wider scientific community. The HAXPES system is integrated into several educational and training programs at Binghamton, including an undergraduate course examining the aesthetics of archeological artifacts within the context of their chemical and physical properties.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

可以通过分析从X射线激发的材料中弹出的弹出电子的速度来无损地测量固体的化学和电子性能。对于大多数基于商业实验室的软X射线源，大多数逃脱电子都来自材料的最高层，使其成为表面化学的敏感探针。尽管表面对于许多在催化剂和电子设备中的应用非常重要，但表面的化学反应通常与下面的大块明显不同。使用更艰苦的X射线会增加材料内部更深层次的电子的百分比，但是到目前为止，此类批量研究仅限于专门的国家设施。新的高性能硬性X射线源和检测器的最新进展使大学实验室环境中可相比的散装敏感测量值，从而提出了增加对这项新兴技术的经济高效手段。增加的非破坏性化学深度促进使得对实际设备架构中掩埋层的掩埋过程（例如晶体管，太阳能电池和电池）的发展有了新的见解。该项目可访问新工具。该项目将该工具纳入宾厄姆顿大学的各种现有招聘和教育计划，以增加茎的保留率并在下一代能源收获，存储和效率的下一代技术中发展劳动力。 Project提供了一种新型的基于实验室的硬X射线光电子光谱（HAXPES）系统，用于在宾厄姆顿大学对真实材料和设备的非破坏性化学分析。同步基金设施的HAXPES研究能够在真实材料和设备的先前无法接近的区域进行精确的化学和电子测量。基于实验室的HAXPES仪器由一种新型的单色GA K-EDGE液体喷射X射线源（9.25 KEV），可实现核心和价带研究，采样深度高达60 nm。该仪器大大增加了对该技术的访问，超出了目前在全球范围内运行的少数基于同步加速器的HAXPES系统。与宾厄姆顿（Binghamton）的联邦资助中心以及整个美国的合作机构（学术和工业）合作机构正在开发现场和操作数HAXPES功能，用于在下一代晶体管和（照片 - ）在（照片 - ）电池中研究活动层和掩埋的接触功能他们的操作。 HAXPES仪器位于专用的用户设施中，以访问更广泛的科学界。 HAXPES系统纳入了宾厄姆顿的几个教育和培训计划，其中包括一门本科课程，在其化学和物理特性的背景下检查考古文物的美学。该奖项反映了NSF的法定任务，并被认为是通过使用评估的支持值得的。基金会的智力优点和更广泛的影响审查标准。

项目成果

期刊论文数量（3）

专著数量（0）

科研奖励数量（0）

会议论文数量（0）

专利数量（0）

Laboratory-based Hard X-ray Photoelectron Spectroscopy for Fundamental and Industrial Research

用于基础和工业研究的实验室硬 X 射线光电子能谱

DOI：
10.1380/vss.64.493
发表时间：
2021
期刊：
Vacuum and Surface Science
影响因子：
0
作者：
HASHIMOTO, Takahiro;AMANN, Peter;REGOUTZ, Anna;BARRETT, Nick;PIPER, Louis F.;HAMOUDA, Wassim;RENAULT, Olivier;LUNDWALL, Marcus;MACHIDA, Masatake
通讯作者：
MACHIDA, Masatake

Surface Chemistry Dependence on Aluminum Doping in Ni-rich LiNi0.8Co0.2−yAlyO2 Cathodes

富镍 LiNi0.8Co0.2−yAlyO2 阴极中铝掺杂的表面化学依赖性

DOI：
10.1038/s41598-019-53932-6
发表时间：
2019
期刊：
Scientific Reports
影响因子：
4.6
作者：
Lebens-Higgins, Zachary W.;Halat, David M.;Faenza, Nicholas V.;Wahila, Matthew J.;Mascheck, Manfred;Wiell, Tomas;Eriksson, Susanna K.;Palmgren, Paul;Rodriguez, Jose;Badway, Fadwa
通讯作者：
Badway, Fadwa

Designing catalysts for water splitting based on electronic structure considerations