SaTC-EDU: PHIKS - PHysical Inspection and attacKs on electronicS

SATC-EDU：PHIKS - 物理检查和电子攻击

• 批准号: 1821780
• 负责人: Navid Asadi
• 金额: $ 30万
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2018
• 资助国家: 美国
• 起止时间: 2018-08-01 至 2022-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1821780&HistoricalAwards=false
• 关键词: SaTC; EDU; PHIKS; PHysical; Inspection

The hardware security community has grown significantly over the past decade. However, research on the most advanced topics such as reverse engineering, physical attacks, and counterfeit detection remains stuck in the early stages of investigation and/or development. First, owning and maintaining the required instrumentation is too prohibitive for academia, thereby limiting research to a few focused labs in industry and government. Second, the knowledge and expertise needed to fully understand these topics and to address their challenges lies at the intersection of multiple non-overlapping scientific fields including microscopy, physics, material science, and computer engineering. Third, electronic hardware spans multiple levels (device, chip, printed circuit board, and system), which are each subject to unique attack modes and requirements. Although some book chapters and surveys have attempted to bridge these gaps, they only introduce the basic concepts to academic researchers, students, and practitioners.The goal of this project is to create a course that exposes students to advanced topics in hardware security. Specifically, ten educational modules will be created that cover (1) the background and motivation for destructive and non-destructive reverse engineering, invasive and non-invasive probing, fault injection, and counterfeit detection; (2) the fundamentals of inspection/attack equipment including optical microscope, scanning electron microscope (SEM), focused ion beam (FIB), photon emission microscope (PEM), and X-ray microscope (XRM); and (3) an introduction to the image processing, machine learning, and classification techniques needed to make sense of microscopy data in the context of hardware security. The components of each module will include one or more lectures, an interactive equipment demonstration, an archetypal data set, and multiple forms of assessment (quiz, lab experiment, and exam). Data sets and demos will be generated based on prior research experiments as well as new experiments using the world class instruments available at University of Florida. By making the educational materials available to the academic community, this project will have a significant impact on education and workforce development in cybersecurity, failure analysis, and electronics testing.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

硬件安全社区在过去十年中取得了显着发展。 然而，对逆向工程、物理攻击和伪造品检测等最先进主题的研究仍然停留在调查和/或开发的早期阶段。 首先，拥有和维护所需的仪器对于学术界来说过于昂贵，从而将研究限制在工业界和政府的少数重点实验室。 其次，充分理解这些主题并应对其挑战所需的知识和专业知识存在于多个非重叠科学领域的交叉点，包括显微镜、物理学、材料科学和计算机工程。 第三，电子硬件跨越多个层面（设备、芯片、印刷电路板和系统），每个层面都受到独特的攻击模式和要求的影响。 尽管一些书籍章节和调查试图弥合这些差距，但它们只向学术研究人员、学生和从业者介绍基本概念。该项目的目标是创建一门课程，让学生了解硬件安全方面的高级主题。 具体来说，将创建十个教育模块，涵盖（1）破坏性和非破坏性逆向工程、侵入性和非侵入性探测、​​故障注入和伪造品检测的背景和动机； （2）光学显微镜、扫描电子显微镜（SEM）、聚焦离子束（FIB）、光子发射显微镜（PEM）、X射线显微镜（XRM）等检测/攻击设备的基础知识； (3) 介绍在硬件安全的背景下理解显微镜数据所需的图像处理、机器学习和分类技术。 每个模块的组成部分将包括一个或多个讲座、交互式设备演示、原型数据集和多种形式的评估（测验、实验室实验和考试）。数据集和演示将根据先前的研究实验以及使用佛罗里达大学可用的世界一流仪器的新实验来生成。通过向学术界提供教育材料，该项目将对网络安全、故障分析和电子测试方面的教育和劳动力发展产生重大影响。该奖项反映了 NSF 的法定使命，并通过使用基金会的智力价值和更广泛的影响审查标准。

项目成果

First Auto-Magnifier Platform for Hardware Assurance and Reverse Engineering Integrated Circuits

第一个用于硬件保证和逆向工程集成电路的自动放大器平台

• 发表时间: 2019
• 期刊: Microscopy and Microanalysis
• 影响因子: 2.8
• 作者: Ronald Wilson, Navid Asadizanjani

Machine Learning Assisted Counterfeit IC Detection through Non-destructive Infrared (IR) Spectroscopy Material Characterization

• DOI: 10.1109/ectc51906.2022.00355
• 发表时间: 2022-05
• 期刊: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
• 作者: Chengjie Xi;Nathan Jessurun;John True;Aslam A. Khan;M. Tehranipoor;Navid Asadizanjani

On Optical Attacks Making Logic Obfuscation Fragile

论光学攻击使逻辑混淆变得脆弱

• 发表时间: 2020
• 期刊: ITC-asia
• 作者: Leonidas Lavdas, M Tanjidur

Survey of terahertz photonics and biophotonics

太赫兹光子学和生物光子学综述

• DOI: 10.1117/1.oe.59.6.061629
• 发表时间: 2020
• 期刊: Optical engineering
• 影响因子: 1.3
• 作者: Kiarash Ahi, Nathan Jessurun

Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing

使用物理检查和高级图像处理检测由不受信任的代工厂插入的硬件木马

• DOI: 10.1007/s41635-018-0055-0
• 发表时间: 2018
• 期刊: Journal of Hardware and Systems Security
• 作者: Vashistha, Nidish;Rahman, M. Tanjidur;Shen, Haoting;Woodard, Damon L.;Asadizanjani, Navid;Tehranipoor, Mark
• 通讯作者: Tehranipoor, Mark