CAREER: Tracking Charge and Energy Transfer at Buried Organic Interfaces

职业：跟踪埋藏有机界面的电荷和能量转移

• 批准号: 1654404
• 负责人: Sean Roberts
• 金额: $ 55万
• 依托单位: University of Texas at Austin
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2017
• 资助国家: 美国
• 起止时间: 2017-03-15 至 2023-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1654404&HistoricalAwards=false
• 关键词: CAREER; Tracking; Charge; Energy; Transfer

In this project supported by the Chemical Structure, Dynamics and Mechanisms-A Program, Professor Sean Roberts and his students at the University of Texas at Austin are developing new laser-based optical tools which enable the study of electric charge transfer processes occurring at the interfaces of films composed of semiconducting organic molecules. The research advances our knowledge about the properties of electrically conductive molecules, and may also advance the application of this class of molecules in solar energy technology. The project provides a vehicle for the training of graduate and undergraduate students in chemistry, optical physics, and materials science. A significant part of the undergraduates' involvement occurs through a collaboration with Austin Community College.The primary goal of this project is to establish the structure-function relationships that guide interfacial charge and energy transfer at two model organic semiconducting (OSC) interfaces: (1) squaraine dye:fullerene heterojunctions used to separate charge in organic photovoltaics, and (2) silicon and Indium-Gallium-Arsenic (InGaAs) surfaces that have been sensitized with singlet fission-capable acene molecules. To measure the electronic structure and dynamics of these interfaces, the Roberts groups is employing steady-state and time-resolved measurements based on an interface-specific technique, Electronic Sum Frequency Generation (ESFG). ESFG allows for selective viewing of energy and electron transfer at OSC interfaces. By using these spectroscopic methods in conjunction with conventional thin film characterization tools and material processing methods that can alter molecular packing at heterojunctions, the project allows the research group to establish structure-function relationships that can improve the efficiency of energy transfer and charge separation at buried OSC interfaces and potentially advances photovoltaic technologies.

在这个由化学结构、动力学和机理 A 计划支持的项目中，德克萨斯大学奥斯汀分校的 Sean Roberts 教授和他的学生正在开发新的基于激光的光学工具，该工具能够研究界面处发生的电荷转移过程由半导体有机分子组成的薄膜。这项研究增进了我们对导电分子特性的认识，也可能推进此类分子在太阳能技术中的应用。该项目为化学、光学物理和材料科学方面的研究生和本科生的培训提供了工具。本科生的参与很大一部分是通过与奥斯汀社区学院的合作进行的。该项目的主要目标是建立结构-功能关系，以指导两个模型有机半导体 (OSC) 界面上的界面电荷和能量转移：(1 ) 方酸菁染料：用于分离有机光伏中电荷的富勒烯异质结，以及 (2) 已通过单态裂变能力敏化的硅和铟镓砷 (InGaAs) 表面并苯分子。为了测量这些界面的电子结构和动态，罗伯茨小组正在采用基于界面特定技术电子和频生成（ESFG）的稳态和时间分辨测量。 ESFG 允许选择性地查看 OSC 界面上的能量和电子转移。通过将这些光谱方法与传统的薄膜表征工具和可以改变异质结处分子堆积的材料加工方法结合使用，该项目使研究小组能够建立结构-功能关系，从而提高掩埋处的能量转移和电荷分离的效率。 OSC 接口并有可能推动光伏技术的发展。

项目成果

Sensitivity of sum frequency generation experimental conditions to thin film interference effects

和频发生实验条件对薄膜干涉效应的敏感性

• DOI: 10.1063/5.0039897
• 发表时间: 2021
• 期刊: The Journal of Chemical Physics
• 作者: Cotton, Daniel E.;Roberts, Sean T.
• 通讯作者: Roberts, Sean T.

Singlet Fission Involves an Interplay between Energetic Driving Force and Electronic Coupling in Perylenediimide Films

• DOI: 10.1021/jacs.7b11888
• 发表时间: 2018-01-17
• 期刊: JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
• 影响因子: 15
• 作者: Le, Aaron K.;Bender, Jon A.;Roberts, Sean T.
• 通讯作者: Roberts, Sean T.

Using Electronic Sum-Frequency Generation to Analyze the Interfacial Structure of Singlet Fission-Capable Perylenediimide Thin Films

• DOI: 10.1021/acs.jpcc.0c01025
• 发表时间: 2020-05-28
• 期刊: JOURNAL OF PHYSICAL CHEMISTRY C
• 影响因子: 3.7
• 作者: Cotton, Daniel E.;Moon, Aaron P.;Roberts, Sean T.
• 通讯作者: Roberts, Sean T.

Moisture-Driven Formation and Growth of Quasi-2-D Organolead Halide Perovskite Crystallites

• DOI: 10.1021/acsaem.0c00423
• 发表时间: 2020-06
• 作者: Bryan R. Wygant;Geoffrey T Geberth;Alexandre Z. Ye;A. Dolocan;Daniel E. Cotton;S. Roberts;D. V. Vanden Bout;C. Mullins

Using Heterodyne-Detected Electronic Sum Frequency Generation To Probe the Electronic Structure of Buried Interfaces

利用外差检测电子和频产生来探测埋入界面的电子结构

• DOI: 10.1021/acs.jpcc.7b05514
• 发表时间: 2017
• 期刊: The Journal of Physical Chemistry C
• 作者: Moon, Aaron P.;Pandey, Ravindra;Bender, Jon A.;Cotton, Daniel E.;Renard, Benny A.;Roberts, Sean T.
• 通讯作者: Roberts, Sean T.