Collaborative Research: Edge Surface Topography Characterization for Precision Sensing Technology

合作研究:精密传感技术的边缘表面形貌表征

基本信息

  • 批准号:
    1564254
  • 负责人:
  • 金额:
    $ 18.39万
  • 依托单位:
  • 依托单位国家:
    美国
  • 项目类别:
    Standard Grant
  • 财政年份:
    2015
  • 资助国家:
    美国
  • 起止时间:
    2015-08-15 至 2018-12-31
  • 项目状态:
    已结题

项目摘要

Surface topography is a fundamental property for the industrial products, and the number of applications keeps increasing, making the need for adequate control of surfaces and understanding of those topography properties. Surface topography characterization techniques are the backbone of broad research areas and industrial applications such as roughness and texture measurements that are dominantly studied by using atomic force microscopes, scanning electron microscopes or touch-triggered stylus profilers. Currently, there is no way to measure or quantify the edge surface topography other than visually, and the edge surface topography properties and characteristics have not been well-documented. There is a knowledge gap in the fundamental understanding of the edge surface topography and on methodologies for its measurement and characterization. This fundamental research program will utilize optical knife edge diffraction characteristics that can enhance signal-to-noise ratio of sensing sensitivity. The successful implementation of this research will potentially lead to a fundamental shift in measurement methodologies that can be used for a variety of edge surface sensing, monitoring, and inspection for atomic force microscopy probes, diamond cutting tools, grinding wheels, spindles, and milling tools. Research findings will be disseminated through publications, technical presentations, and educational activities, including at the university-level and through outreach efforts spearheaded by the investigators.This project will test the fundamental hypothesis by creating a novel measurement and characterization paradigm in order to find fundamental issues in the relationship between the edge surface topography properties with edge diffraction characteristics. The investigators will generate the edge surface topography patterns with various roughness, sharpness, shape, and materials on edges by using 3D printing, precision grinding, diamond scribing, silicon wet etching, and laser scribing processes. Furthermore, the project will study whether multiple edge sensors can be combined to improve edge detection sensitivity, and how those topologies can be instrumented for validation using experimental techniques. The theoretical and experimental activities in this research will be used to discover fundamental sensing limits of edge surface topography metrology techniques. As a result, a deterministic will be built to enable the quantification of the edge surface topography properties and to establish fundamental design principles in edge surface topography for precision sensing applications.
表面形貌是工业产品的基本属性,并且应用数量不断增加,因此需要对表面进行充分控制并了解这些形貌属性。表面形貌表征技术是广泛研究领域和工业应用的支柱,例如粗糙度和纹理测量,主要使用原子力显微镜、扫描电子显微镜或触摸触发触针轮廓仪进行研究。目前,除了视觉之外,没有其他方法可以测量或量化边缘表面形貌,并且边缘表面形貌属性和特征尚未得到充分记录。对边缘表面形貌及其测量和表征方法的基本理解存在知识差距。该基础研究计划将利用光学刀口衍射特性来提高传感灵敏度的信噪比。这项研究的成功实施将有可能导致测量方法的根本性转变,可用于原子力显微镜探针、金刚石切削工具、砂轮、主轴和铣削工具的各种边缘表面传感、监测和检查。研究结果将通过出版物、技术演示和教育活动(包括在大学层面和研究人员牵头的外展工作)进行传播。该项目将通过创建一种新颖的测量和表征范式来测试基本假设,以找到基本的假设边缘表面形貌特性与边缘衍射特性之间关系的问题。研究人员将通过使用3D打印、精密研磨、金刚石划片、硅湿法蚀刻和激光划片工艺,生成具有各种粗糙度、锐度、形状和边缘材料的边缘表面形貌图案。此外,该项目还将研究是否可以组合多个边缘传感器来提高边缘检测灵敏度,以及如何使用实验技术对这些拓扑进行检测以进行验证。本研究的理论和实验活动将用于发现边缘表面形貌计量技术的基本传感极限。因此,将建立确定性,以实现边缘表面形貌特性的量化,并为精密传感应用建立边缘表面形貌的基本设计原则。

项目成果

期刊论文数量(0)
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ChaBum Lee其他文献

Qualitative Edge Topology Inspection and Interpretation by Enhanced Knife-Edge Interferometry
通过增强型刀口干涉测量法进行定性边缘拓扑检查和解释

ChaBum Lee的其他文献

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{{ truncateString('ChaBum Lee', 18)}}的其他基金

Collaborative Research: Data-Driven Metrology and Inspection Technology for Semiconductor Wafer-Level Manufacturing
合作研究:用于半导体晶圆级制造的数据驱动计量和检测技术
  • 批准号:
    2124999
  • 财政年份:
    2021
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant
Photomask Defect Inspection and Metrology for Semiconductor Lithography Technology
半导体光刻技术的光掩模缺陷检测和计量
  • 批准号:
    1855473
  • 财政年份:
    2019
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant
I-Corps: Cutting Tool Wear Monitoring Sensor
I-Corps:切削刀具磨损监测传感器
  • 批准号:
    1926275
  • 财政年份:
    2019
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant
Collaborative Research: Improved Freeform Measurement through Fiber-based Metrology
合作研究:通过基于光纤的计量改进自由形状测量
  • 批准号:
    1902697
  • 财政年份:
    2018
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant
Collaborative Research: Edge Surface Topography Characterization for Precision Sensing Technology
合作研究:精密传感技术的边缘表面形貌表征
  • 批准号:
    1902686
  • 财政年份:
    2018
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant
Collaborative Research: Improved Freeform Measurement through Fiber-based Metrology
合作研究:通过基于光纤的计量改进自由形状测量
  • 批准号:
    1663210
  • 财政年份:
    2017
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant
Collaborative Research: Edge Surface Topography Characterization for Precision Sensing Technology
合作研究:精密传感技术的边缘表面形貌表征
  • 批准号:
    1463502
  • 财政年份:
    2015
  • 资助金额:
    $ 18.39万
  • 项目类别:
    Standard Grant

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