Collaborative Research: Nonparametric Bayesian Modeling of Reliability of Nonelectronics

合作研究：非电子产品可靠性的非参数贝叶斯建模

• 批准号: 0926420
• 负责人: Tao Yuan
• 金额: --
• 依托单位: Ohio University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-09-01 至 2013-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0926420&HistoricalAwards=false
• 关键词: Collaborative; Research; Nonparametric; Bayesian; Modeling

This grant provides funding for the investigation of reliability in nanoelectronics. Nanoelectronics is a driving force for strong economic growth in the United States. Reliability is recognized as one of the most critical factors in determining the success of nano fabrication and manufacturing. This collaborative project will be led by a nano device engineer and a reliability specialist. The objective of this interdisciplinary research is to investigate effective and practical nonparametric Bayesian methods to assess the reliability of nanoelectronic products during the early design and development stages. Specially, the proposed research tasks consist of two closely-related components: (i) an analytical study to develop practical nonparametric Bayesian methods for estimating important reliability measures of nanoelectronic devices, and (ii) an experimental study to validate the models by fabricating and characterizing newly developed nonvolatile memories based on nanocrystals embedded high-k thin films. Upon the successful completion of this project, new methods and tools that are critical to design and manufacture reliable nanoelectronic products will be developed. This will be the first systematic study in modeling and predicting reliability of nano products based on experimental data and nonparametric Bayesian methods which offer great flexibility and capability to address challenges in real products influencing yield and cost. The result will enable manufacturers to assess reliability of new nano products and involved costs in the early design and development stages, which would expedite products to the market. Furthermore, the new nonvolatile memory devices have practical applications in future generation integrated circuits (ICs) and data storage. This multidisciplinary research project will provides students with both theoretical and experimental education in reliability, semiconductor devices, thin film materials, and high-tech fabrication processes.

该赠款为调查纳米电子学的可靠性调查提供了资金。纳米电子学是美国强劲经济增长的推动力。可靠性被认为是确定纳米制造和制造成功的最关键因素之一。该协作项目将由纳米设备工程师和可靠性专家领导。这项跨学科研究的目的是研究在早期设计和开发阶段评估纳米电子产品可靠性的有效和实用的非参数贝叶斯方法。特别是，拟议的研究任务由两个密切相关的组件组成：（i）一项分析性研究，用于开发实用的非参数贝叶斯方法，用于估算纳米电子设备的重要可靠性测量方法，（ii）通过制造和表征对模型进行验证的实验研究基于纳米晶体嵌入的高K薄膜的新开发的非易失性记忆。成功完成该项目后，将开发对设计和制造可靠的纳米电子产品至关重要的新方法和工具。这将是基于实验数据和非参数贝叶斯方法建模和预测纳米产品可靠性的首次系统研究，这些方法具有极大的灵活性和能力，可以解决影响产量和成本的实际产品的挑战。结果将使制造商能够评估新纳米产品的可靠性，并在早期的设计和开发阶段涉及成本，这将加快产品为市场。此外，新的非易失性存储设备在未来一代集成电路（ICS）和数据存储中具有实际应用。该多学科研究项目将为学生提供有关可靠性，半导体设备，薄膜材料和高科技制造过程的理论和实验教育。