MRI: Development of Rapid Annealing and in situ Characterization System

MRI：快速退火和原位表征系统的开发

• 批准号: 0923292
• 负责人: Boris Nadgorny
• 金额: $ 45.45万
• 依托单位: Wayne State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-10-01 至 2015-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0923292&HistoricalAwards=false
• 关键词: MRI; Development; Rapid; Annealing; situ

AbstractThis instrument development project by a multi-disciplinary team from Wayne State University creates a Rapid Annealing and Characterization System (RACS) capable of rapidly annealing thin film samples and nanomaterials prepared externally and then characterizing these samples in situ using a variety of non-invasive techniques. With this highly flexible system, the researchers will develop and improve techniques to characterize how a variety of defects modify the materials properties. Defects, including dislocations, grain boundaries, impurity dopants, and vacancies have been found to dramatically alter the magnetic, electrical, and optical properties of materials. These defects are important in establishing the properties of nanomaterials, owing to the much higher surface to volume ratio than in bulk systems. The eventual goal of this study, which will focus on nitrides and superconducting thin films, is to control the type, density, and the distribution of defects to enable the synthesis of materials having specifically tailored properties. The custom designed vacuum chamber with rapid annealing capabilities coupled to a Scanning Electron Microscope with Wave Dispersion Spectrometer (WDS) using a proprietary airlock developed by JEOL will allow researchers to modify the defect structure by thermal annealing in one chamber and then conduct studies on the materials properties and defect structure in the second chamber, all without exposing the samples to ambient conditions. The WDS spectrometer is an important component of this study, as it will allow researchers to determine the concentration of oxygen vacancies, which is exceedingly difficult to determine using other techniques. The unique capabilities of RACS will be utilized to systematically probe the effects of a variety of defects on the fundamental properties of nanoscale systems, leading to a deeper understanding of how to tune the materials properties in nanostructured materials. Establishing the processing parameters for optimizing materials properties using RACS would allow the development of scalable fabrication protocols, which would promote the incorporation of these novel nanostructured materials into commercial devices. The development of this system will provide valuable training for a postdoctoral researcher as well as graduate and undergraduate students, specifically including underrepresented minorities in the Detroit metropolitan area.

来自韦恩州立大学的多学科团队由一个多学科团队组成的摘要这项仪器开发项目，创建了一个快速退火和表征系统（RACS），能够快速退火薄膜样本和外部制备的纳米材料，然后使用各种非不创的技术来表征这些样品。通过这种高度灵活的系统，研究人员将开发和改进技术，以表征各种缺陷如何改变材料特性。发现缺陷，包括位错，晶界，杂质掺杂剂和空缺，可极大地改变材料的磁性，电气和光学性质。这些缺陷对于建立纳米材料的性质很重要，这是由于表面与体积比的比率要高得多。这项研究的最终目标将集中于氮化物和超导薄膜，是为了控制缺陷的类型，密度和分布，以使其能够合成具有专门定制特性的材料。具有快速退火能力的定制设计的真空室与扫描电子显微镜以及波散分散光谱仪（WDS），使用由JEOL开发的专有气闸，将使研究人员能够通过在一个腔室中进行热退火来修改缺陷结构，然后在材料上进行材料研究，第二腔中的性质和缺陷结构，所有这些都不将样品暴露于环境条件下。 WDS光谱仪是本研究的重要组成部分，因为它将允许研究人员确定氧气空位的浓度，而使用其他技术非常困难。 RAC的独特功能将用于系统地探测各种缺陷对纳米级系统基本特性的影响，从而更深入地了解如何调整纳米结构材料中的材料特性。建立用于使用RAC进行优化材料特性的处理参数将允许开发可扩展的制造方案，这将促进将这些新型纳米结构材料掺入商业设备中。 该系统的开发将为博士后研究人员以及研究生和本科生提供宝贵的培训，特别是包括底特律大都会地区代表性不足的少数民族。