Using Graphical Processing Units for Enhancement of Metrology Systems

使用图形处理单元增强计量系统

• 批准号: 0600902
• 负责人: Thomas Kurfess
• 金额: $ 30.03万
• 依托单位: Clemson University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2005
• 资助国家: 美国
• 起止时间: 2005-10-05 至 2010-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0600902&HistoricalAwards=false
• 关键词: Using; Graphical; Processing; Units; Enhancement

The objective of this research is to understand how to process large quantities of data being generated by high density, high speed sensor-intense inspection systems. The approach to accomplish this objective is to formulate a new fundamental understanding of computational metrology, as it relates to the computational geometry techniques used in accelerated computer graphics. This formulation will ultimately be realized on graphical processor units that are incorporated into most computer video cards. Graphically intensive computer applications such as games have driven a significant increase in the capabilities of these cards, and made them readily available on most computer systems. The newly reformulated metrology algorithms will operate orders of magnitude faster on these systems.If successful, the benefits of this research will include improved inspection and quality control capabilities for a wide variety of manufacturers. Manufacturers that will benefit the most are those whose product is high precision and high volume. In particular, firms targeting the micro and nano manufacturing sectors will be able to efficiently and cost effectively monitor and improve their processes and products. Such an increase in quality control will ultimately yield a stronger and more competitive position for manufacturers in the United States, in a variety of sectors including the emerging areas of MEMS, micro and nano-systems.

这项研究的目的是了解如何处理高密度，高速传感器强态检查系统生成的大量数据。实现这一目标的方法是对计算计量学的新基本了解，因为它与加速计算机图形中使用的计算几何技术有关。该公式最终将在大多数计算机视频卡中纳入的图形处理器单元上实现。图形密集的计算机应用程序（例如游戏）驱动了这些卡的功能的显着增加，并使其在大多数计算机系统上都很容易获得。新印度的计量算法将在这些系统上运行速度更快。如果成功，这项研究的好处将包括改进的检查和各种制造商的质量控制能力。 受益最多的制造商是那些产品高精度和高量的制造商。特别是，针对微型和纳米制造业的公司将能够有效地监视和改善其流程和产品。质量控制的这种提高最终将为美国的制造商，包括MEMS，微型和纳米系统的新兴领域的各个部门，在美国的制造商中产生更强大，更具竞争力的地位。