Integrity Monitoring and Recovery Techniques for Next Generation Submicron Microprocessors

下一代亚微米微处理器的完整性监控和恢复技术

• 批准号: 0311061
• 负责人: Arun Somani
• 金额: --
• 依托单位: Iowa State University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2003
• 资助国家: 美国
• 起止时间: 2003-08-01 至 2008-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0311061&HistoricalAwards=false
• 关键词: Integrity; Monitoring; Recovery; Techniques; Next

Integrity Monitoring and Recovery Techniques for Error-Prone Submicron MicroprocessorsAs advances in VLSI technology reduce circuit dimensions dramatically, processor chips become more vulnerable to soft errors. Thus dependability is becoming an increasingly important quality measure of microprocessors. A transient and/or permanent processor failure could have diverse impacts on our daily lives. The goals of the proposed research are: (1) to characterize soft error behavior on commercial microprocessors through fault injection experiments; (2) to provide a guideline for exploiting soft error susceptibility in integrity checking strategy and predicting the error characteristics from the processor's architecture; and (3) to develop comprehensive micro-architectural solutions.We will investigate individual components of the processor with circuit-level approaches. Subsequently, we will study the area overhead vs. fault coverage trade-off to show the effectiveness of our proposed solutions. We will be developing specific tailored dependability solutions that are independent of technology and based on fault occurrence and error propagation characteristics of a given processor architecture. The techniques are easily adapted to future generations of architectures.Since use of microprocessors and micro controllers is very wide spread and affects every aspect of our lives, improvement in the dependability of such systems would have the widest possible broader impact.

VLSI技术中易用错误的亚微密度问题的完整性监视和恢复技术大大降低了电路尺寸，处理器芯片变得更容易受到软错误的影响。因此，可靠性正在成为微处理器的质量越来越重要。瞬态和/或永久处理器故障可能会对我们的日常生活产生不同的影响。拟议的研究的目标是：（1）通过故障注入实验表征商业微处理器的软错误行为； （2）提供一个指南，以利用完整性检查策略中的软误差易感性并预测处理器体系结构的错误特征； （3）开发全面的微构造解决方案。我们将使用电路级别的方法研究处理器的个别组件。随后，我们将研究该区域高架与故障覆盖范围的权衡，以显示我们提出的解决方案的有效性。我们将开发特定的量身定制的可靠性解决方案，这些解决方案独立于技术，并基于给定处理器体系结构的故障发生和错误传播特征。这些技术很容易适应后代的架构。在使用微处理器和微控制器的情况下，这是非常广泛的传播，并影响了我们生活的各个方面，改善此类系统的可靠性将带来最大的广泛影响。