Graphene investigated by dynamic non-contact atomic force microscopy

通过动态非接触原子力显微镜研究石墨烯

• 批准号: 141354617
• 负责人: Professor Dr. Roland Wiesendanger
• 金额: --
• 依托单位: Institut für Nanostruktur- und Festkörperphysik (INF)
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2009
• 资助国家: 德国
• 起止时间: 2008-12-31 至 2011-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/141354617?language=en
• 关键词: Graphene; investigated; dynamic; non; contact

The aim of the project is the investigation of mono- and bi-layer graphene flakes with atomic resolution using the method of dynamic non-contact atomic force microscopy (NC-AFM). The three central goals are:1. The determination of the detailed surface and interface structure of graphene with the highest accuracy by means of dynamic NC-AFM imaging and 3D force-field spectroscopy measurements on mesoscopic down to atomic scales. In particular, we aim at a detailed comparison of structural and mechanical properties between mono- and bi-layers of graphene. Furthermore, we would like to study the influence of atomically-localized strain, originating from geometrical defects (e.g. pentagonal rings), atomic vacancies, or single adsorbates, on the nanomechanical properties of graphene. The evaluation of the nanomechanical properties (e.g. effective elastic modulus) will be performed by precise measurements of the mechanical responses to the atomically sharp AFM tip as extracted from 3D force-field spectroscopy with atomic resolution.2. The evaluation of atomic defects and their correlation with soft vibrational modes by means of energy-loss AE measurements with threedimensional spatial resolution, using simultaneous dynamic NC-AFM imaging and 3D force-field spectroscopy measurements. In particular, we will investigate the relationship between types and locations of atomic defects and local excitations of soft vibrational modes.3. The correlation of local electronic and electrostatic properties with electron transport, taking into account the number of carbon layers, the size of two-dimensional crystal domains, the presence of atomically-localized strain due to the presence of defects, and the degree of the electronic coupling of graphene to the substrate.

该项目的目的是使用动态非接触原子力显微镜（NC-AFM）方法以原子分辨率研究单层和双层石墨烯薄片。这三个中心目标是： 1．通过动态 NC-AFM 成像和介观至原子尺度的 3D 力场光谱测量，以最高精度确定石墨烯的详细表面和界面结构。特别是，我们的目标是详细比较单层和双层石墨烯的结构和机械性能。此外，我们还想研究源自几何缺陷（例如五边形环）、原子空位或单个吸附物的原子局部应变对石墨烯纳米力学性能的影响。纳米力学特性（例如有效弹性模量）的评估将通过精确测量原子分辨率的 3D 力场光谱中提取的原子级尖锐 AFM 尖端的机械响应来进行。2。使用同步动态 NC-AFM 成像和 3D 力场光谱测量，通过具有三维空间分辨率的能量损失 AE 测量来评估原子缺陷及其与软振动模式的相关性。特别是，我们将研究原子缺陷的类型和位置与软振动模式的局部激发之间的关系。3．局域电子和静电性质与电子传输的相关性，考虑到碳层的数量、二维晶域的大小、由于缺陷的存在而存在的原子局域应变以及电子化的程度石墨烯与基底的耦合。