Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
基本信息
- 批准号:9820836
- 负责人:
- 金额:$ 22.5万
- 依托单位:
- 依托单位国家:美国
- 项目类别:Continuing Grant
- 财政年份:1999
- 资助国家:美国
- 起止时间:1999-06-01 至 2003-05-31
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
9820836LiebermanChemically reactive plasma discharges are widely used in the semiconductor and fiat panel display indus-tries for etching and deposition processes; moreover, their use has become critical for VLSI circuit and thin film transistor (TFT) production. High density rf inductively coupled plasma sources will play an increasing role in processing as feature sizes shrink and as wafer and TFT substrate sizes increase. This proposal is for continuation of research on such discharges. The program involves (a) experiments and analytical models for a large area plasma source (LAPS) that is inductively excited by an rf traveling wave launched onto an antenna coil embedded within the plasma volume, and (b) theories and experiments to examine equilibrium, hysteresis, and unstable behavior in inductively coupled plasma sources with electronegative gas feedstocks.The LAPS has favorable properties for scaling to large sizes. Plasma in the source is generated in a rectangular box 71.1 cm x 61.0 cm x 20.3 cm containing a substrate holder large enough to study processing of silicon wafers as large as 300 mm in diameter and fiat panel glass substrate sizes as large as 360 mm x 465 mm. A critical issue to be examined in the experiments is whether traveling wave excitation of a coil embedded in the plasma can generate uniform plasmas and materials processing over large areas.The studies of electronegative discharge equilibrium, hysteresis, and instabilities will be performed in a planar inductive discharge (transformer-coupled plasma, or TCP) of the conventional type used for VLSI processing. Feedstock gases for etch applications will be used, including chlorine, oxygen, SF6, and their mixtures with argon.***
9820836 Liebermanchemnation用反应性等离子体排放广泛用于半导体和菲亚特面板展示工业,用于蚀刻和沉积过程;此外,它们的使用对于VLSI电路和薄膜晶体管(TFT)生产至关重要。高密度RF电感耦合的等离子源将在处理中发挥越来越多的作用,因为特征尺寸缩小,并且随着晶圆和TFT底物的增加而增加。该建议是为了继续进行此类排放研究。该程序涉及(a)大面积等离子体源(LAP)的实验和分析模型,该模型是通过启动到嵌入在等离子体体积中的天线线圈上的RF行驶波的感应激发的,以及(b)检查平衡,以检查平衡,检查平衡带有电源气体原料的电感耦合等离子体源中的磁滞和不稳定的行为。圈圈具有缩放到大尺寸的有利特性。源中的血浆是在矩形盒71.1 cm x 61.0 cm x 20.3 cm中产生毫米。实验中要检查的一个关键问题是,嵌入等离子体中的线圈的行动波激发是否可以在大面积上产生均匀的等离子体和材料处理。电负性放电平衡,磁滞和不稳定性的研究将在平面电感上进行。用于VLSI处理的常规类型的排放(变压器偶联等离子体或TCP)。将使用用于蚀刻应用的原料气体,包括氯,氧气,SF6及其与氩气的混合物。***
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Michael Lieberman其他文献
Implementing an Automated Prediction Model to Improve Prescribing of HIV Preexposure Prophylaxis
实施自动预测模型以改善 HIV 暴露前预防的处方
- DOI:
10.1056/cat.23.0215 - 发表时间:
2023 - 期刊:
- 影响因子:0
- 作者:
D. Krakower;Michael Lieberman;Miguel Marino;Jun Hwang;Kenneth H. Mayer;Julia L Marcus - 通讯作者:
Julia L Marcus
Michael Lieberman的其他文献
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{{ truncateString('Michael Lieberman', 18)}}的其他基金
Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
- 批准号:
0139956 - 财政年份:2002
- 资助金额:
$ 22.5万 - 项目类别:
Standard Grant
Pulsed Power Plasma Discharges Used for Materials Processing
用于材料加工的脉冲功率等离子体放电
- 批准号:
9602544 - 财政年份:1997
- 资助金额:
$ 22.5万 - 项目类别:
Standard Grant
Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
- 批准号:
9529658 - 财政年份:1996
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
- 批准号:
9217500 - 财政年份:1993
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Dynamic of R.F. Discharges for Materials Etching (REU SUPPLEMENT)
R.F.动态
- 批准号:
8910827 - 财政年份:1990
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Workshop on New Directions in Plasma Engineering U. C. Berkeley, June 9-10, 1988
等离子体工程新方向研讨会 加州大学伯克利分校,1988 年 6 月 9-10 日
- 批准号:
8802870 - 财政年份:1988
- 资助金额:
$ 22.5万 - 项目类别:
Standard Grant
Supplement:Dynamics of R.F. Discharges for Materials Etching
补充:R.F.的动力学
- 批准号:
8517363 - 财政年份:1986
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Role of Chromatin Structure in the Repair of Ultraviolet Radiation Induced Damage in Human Cells
染色质结构在修复紫外线辐射引起的人体细胞损伤中的作用
- 批准号:
7805834 - 财政年份:1978
- 资助金额:
$ 22.5万 - 项目类别:
Standard Grant
相似海外基金
Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
- 批准号:
0139956 - 财政年份:2002
- 资助金额:
$ 22.5万 - 项目类别:
Standard Grant
Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
- 批准号:
9529658 - 财政年份:1996
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Dynamics of R.F. Discharges for Materials Etching
R.F. 的动力学
- 批准号:
9217500 - 财政年份:1993
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Dynamic of R.F. Discharges for Materials Etching (REU SUPPLEMENT)
R.F.动态
- 批准号:
8910827 - 财政年份:1990
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant
Supplement:Dynamics of R.F. Discharges for Materials Etching
补充:R.F.的动力学
- 批准号:
8517363 - 财政年份:1986
- 资助金额:
$ 22.5万 - 项目类别:
Continuing Grant