Annihilation of free volumes and residual strain in nanocrystalline metal layers

纳米晶金属层中自由体积和残余应变的消失

• 批准号: 109158040
• 负责人: Professor Dr. Harald Schmidt
• 金额: --
• 依托单位: Institut für Metallurgie
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2009
• 资助国家: 德国
• 起止时间: 2008-12-31 至 2014-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/109158040?language=en
• 关键词: Annihilation; free; volumes; residual; strain

Topic of the present project is the basic understanding and mutual correlation of the following physical processes in materials: (1) relaxation of residual strain, (2) temporal change of vacancy concentration, (3) structural re-orientation of grains, and finally (4) self-diffusion processes. The time-resolved (minutes) determination of vacancy concentration, residual strain, and structural re-orientation is done with the newly developed method of Synchrotron based differential dilatometry. There, the lattice parameters and the film thickness are measured (quasi-)simultaneously in-situ during isothermal annealing by X-ray diffractometry and X-ray reflectometry. Investigation of self-diffusion (in grains and grain boundaries) in a stable nano-structure is accomplished with focusing neutron reflectometry on isotope multilayers. In order to obtain a reliable comparison of results, all experiments are carried out on the same type of samples. The planned fundamental research will help to understand microstructural and stress controlled processes in nano-crystalline metals and will also help to optimize the properties of these materials.

本项目的主题是对材料中以下物理过程的基本理解和相互关联：（1）残余应变的松弛，（2）空位浓度的时间变化，（3）晶粒的结构重新取向，最后（ 4）自扩散过程。空位浓度、残余应变和结构重新取向的时间分辨（分钟）测定是使用新开发的基于同步加速器的微分膨胀法来完成的。在那里，通过 X 射线衍射法和 X 射线反射法在等温退火过程中（准）同时原位测量晶格参数和膜厚度。通过将中子反射计聚焦在同位素多层上，可以研究稳定纳米结构中的自扩散（晶粒和晶界）。为了获得可靠的结果比较，所有实验均在同一类型的样品上进行。计划中的基础研究将有助于了解纳米晶金属的微观结构和应力控制过程，也将有助于优化这些材料的性能。

项目成果

Structural Re-Organization Kinetics of Nanocrystalline Pt Films during In Situ Annealing

原位退火过程中纳米晶 Pt 薄膜的结构重组动力学

• DOI: 10.4028/www.scientific.net/ddf.323-325.149
• 发表时间: 2012
• 期刊: Defect and Diffusion Forum
• 作者: W. Gruber;S. Chakravarty;C. Baehtz;H. Schmidt
• 通讯作者: H. Schmidt

A SIMS Study on Self-Diffusion in Thin Nano-Crystalline Platinum Films

纳米晶铂薄膜自扩散的SIMS研究

• DOI: 10.4028/www.scientific.net/ddf.363.219
• 发表时间: 2015
• 期刊: Defect and Diffusion Forum
• 作者: W. Gruber;J. Rahn;F. Strauss;L. Dörrer;H. Schmidt
• 通讯作者: H. Schmidt

Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films

• DOI: 10.1007/s10853-016-0458-7
• 发表时间: 2017-02
• 期刊: Journal of Materials Science
• 影响因子: 4.5
• 作者: W. Gruber;C. Baehtz;T. Geue;J. Stahn;H. Schmidt

Microstructure and strain relaxation in thin nanocrystalline platinum films produced via different sputtering techniques

通过不同溅射技术生产的纳米晶铂薄膜的微观结构和应变松弛

• DOI: 10.1016/j.apsusc.2016.02.015
• 发表时间: 2016
• 期刊: Applied Surface Science
• 影响因子: 6.7
• 作者: W. Gruber;C. Baehtz;M. Horisberger;H. Schmidt
• 通讯作者: H. Schmidt

Influence of a passivation layer on strain relaxation and lattice disorder in thin nano-crystalline Pt films during in-situ annealing

原位退火过程中钝化层对纳米晶 Pt 薄膜应变弛豫和晶格无序的影响

• DOI: 10.1016/j.tsf.2014.06.048
• 发表时间: 2014
• 期刊: Thin Solid Films
• 影响因子: 2.1
• 作者: W. Gruber;J. Rahn;C. Baehtz;M. Horisberger;U. Geckle;H. Schmidt
• 通讯作者: H. Schmidt